EEE Links Vol. 3, No. 1

SINGLE EVENT EFFECT TEST RESULTS FOR CANDIDATE SPACECRAFT ELECTRONICS Kenneth A. LaBel (301) 286-9936 label@gsfc.nasa.gov Amy K. Moran (301) 286-1412 amy.k.moran.1@gsfc.nasa.gov or ken. NASA/GSFC, Code 735

We present a collection of both heavy ion and proton single event effect (SEE) ground test results performed in the past year for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links.

The SEE test objective was to determine the Linear Energy Transfer (LET) threshold (the minimum LET value to cause an effect at a fluence of 1E7 particles/cm²) and saturation cross section of candidate spacecraft electronics for Single Event Upset (SEU) and Single Event Latchup (SEL) due to protons and heavy ions.

TEST FACILITIES

Heavy Ion experiments were performed at the Brookhaven National Laboratories (BNL) Single Event Upset Test Facility (SEUTF), and at the Texas A&M University Cyclotron. Proton SEE testing was performed at both the University of California at Davis (UCD) and the University of Indiana (UICF) at Bloomington cyclotron facilities. All tests were performed between February 1996 and January 1997. Details on ions and energies used are available upon request.

TEST METHOD

Three modes of testing were used, depending on the DUT. They are:

static - load device prior to beam irradiation, then retrieve data post-run, counting errors
dynamic - actively exercise a DUT during beam exposure while counting errors
biased (SEL only) - DUT is biased and clocked while I_cc (power consumption) is monitored for latchup.

SEU was defined on a device-by-device basis, depending on device functionality and project requirements. All tests were performed at room temperature, unless noted.

TEST RESULTS

Table 1 summarizes the devices tested for SEE and the test results, using the following conventions:

HI = heavy ion test
P = proton test
SEU = SEU LET_th (MeV*cm²/mg)
SEL = SEL LET_th (MeV*cm²/mg)
_ = cross section (cm²/device, unless specified as cm²/bit)

Table 1
DEVICE	FUNCTION	MANUF.	TEST RESULTS	NOTES
RAM (Random Access Memory)
Luna-ES2	4Mx4 DRAM	IBM	HI SEU < 3.38 SEL > 11.5
KM48V8100AS-16	64M DRAM	Samsung	P _ ~ 1.03E-14/bit (single bit upset only)	voltage-dependent
628128	128kx8 SRAM	Hitachi/ ELMO	P _ ~ 1.2E-13/bit	pattern-sensitive
88130L45PC	128kx8 SRAM	Hitachi/ EDI	P _ ~ 1.7E-13/bit	not pattern-sensitive
MT5C1008CW-25	128kx8 SRAM	Micron	P _ ~ 3E-7
_PD4216400-60	4Mx4 DRAM	NEC	P _ ~ 7.76E-12/bit (single bit upset only)
TMS416400DJ-60	4Mx4 DRAM	TI	HI SEU = 3 P _ ~ 5.42E-12/bit (single bit upset only)
TMS416400	4Mx4 DRAM	TI	HI SEU ~ 2 (single bit upset only)
FPs (Field Programmable Gate Arrays)
AT6002-JC	FPGA	Atmel	HI SEU = 7-8 SEL = 11-11.4 P data errors, no reconfig.
3090A	FPGA	Xilinx	HI SEU = 4-7 SEL = 4-7
ATT2C04-2 ORCA	FPGA	AT&T	HI SEU < 7.88 SEL < 7.88
CLAy-31	RAM-based FPGA	NSC	HI SEU ~ 5 SEL > 90 *high-temp HI* SEL ~ 11 P data, reconfig. errors	anomalous current change
14100A	FPGA	Actel	HI SEU ~ 8 (S, I/O mods), 21 (C mods) P S, I/O mod errors
1460A	FPGA	Actel	HI SEU ~ 8 (S, I/O mods), 21 (C mods) P S, I/O mod errors

Data Transmission
HSSR-7110	Power MOSFET Optocoupler	HP	HI no SEU, SEL P no SEU, SEL
UT63M147-BPC	1553 Transceiver	UTMC	HI SEU ~ 11 SEL > 35
DR1773	1773 Transceiver	Boeing	P _ ~ 1.4E-10 (RX) _ < 2E-11 (TX)	attenuation-, angle-dependent
2706T	Fibre Channel Link Transmitter	Force, Inc.	P TBD
2706R	Fibre Channel Link Receiver	Force, Inc.	P TBD
2706T	Fibre Channel Link Transmitter	AT&T	P TBD
2706R	Fibre Channel Link Receiver	AT&T	P TBD
AM7968	TAXI Transmitter	AMD	HI SEU < 3.39 SEL > 53.2 P _ ~ 5.27E-10(data) _ ~ 6.6E-10(sync)
AM7969	TAXI Receiver	AMD	HI SEU < 3.39 SEL > 53.2 P _ ~ 2.56E-10 (data) _ ~ 3E-10 (sync)
Other
5690R-D15	DC-DC Converter	MDI	HI SEU > 82.7 SEL > 82.7
M67204EV-50	4kx9 FIFO	Matra	P _ ~ 8.58E-14(bit) _ ~ 8.3E-13(pointer) _ ~ 2E-12(control)
DAC8800	Octal 8-bit DAC	Analog Devices	HI SEU > 80 SEL > 80
CS5012A	12-bit ADC	Crystal Semi.	HI SEU = 3.5 - 4.8 SEL ~ 11.4	laser test also performed
AD630	Balanced Modulator	Analog Devices	HI SEU < 7.4
AD652	Voltage-to- Frequency Converter	Analog Devices	HI SEU ~ 7.4 SEL >> 15

For more complete results, try our homepage (http://flick.gsfc.nasa.gov/radhome.htm) or contact us via e-mail. Recommendations

Following heavy ion and proton testing , devices generally are categorized into one of four categories for recommendation to the flight project of interest:

relatively hard or immune to SEEs and recommended for spaceflight
somewhat susceptible to SEEs; may need some error detection and correction (EDAC) when used in an application
fairly soft, and very susceptible to SEEs; use with great caution, if at all. Intensive EDAC schemes may be necessary as these devices have potentially high error rates.
not recommended for spaceflight. Destructive conditions, such as latchup, total dose failure or burnout, were seen in these devices at low LETs.

Recommendations are available on our homepage when applicable.