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Survey of Heterojunction Bipolar Transitor (HBT) Device Reliability
File Name: pub_hbt_paper.pdf | Date Submitted: 02/12/04
 

File Size:
362KB
Document Author
Marcellus Proctor - Marcellus.A.Proctor@nasa.gov
Goddard Space Flight Center
Phone: 301-286-8838 | FAX: 301-286-9778
[Additional User Information]

Download "Survey of Heterojunction Bipolar Transitor (HBT) Device Reliability" (362KB) Now.
 
Description:
 
Abstract:
 
Related Project(s):
EPAC (Electronic Packaging)
EPAR (Electronic Parts)
 
Related Area(s) of Emphasis:
System on a chip (SOC) and System in a package (SIAP) Reliability
Newly Available Technologies and COTS

 
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