Mixed-signal devices, such as analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) have continued to advance to very high bit count (up to 24), while adding additional functions within the chip (e.g., sample-and-hold, references, etc.). Flight projects have been seeking to use higher accuracy and higher speed devices with additional functionality. However, due to the nature of ADCs and DACs, radiation performance can often be a limiting factor for device usage and applicability. This task focuses on documenting the existing knowledge-base of radiation effects on ADCs and DACs including test methods for qualification. Identification of knowledge-gaps for future research efforts will be included.
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