Space exploration programs often require that sensors and instruments with related service electronics are exposed to outer space, thus subjecting them to extreme environmental conditions.  In programs such as lunar and Martian expeditions and deep-space exploration these conditions include cryogenic temperatures.  The major requirement for electronic components used in any space application is high reliability, which is assured by a system of screening and qualification testing and analyses designed to minimize the risk of failures during the mission. This system is well developed for components operating within the military range of temperatures (typically -55C to 125C); however, there are no established standards or guidelines that would help part engineers in developing reliability testing programs at cryogenic conditions.  Moreover, the reliability of electronic deives at these conditions has not been studied sufficiently yet and information is lacking even about the performance of active and passive components at extremely low temperatures.  This requires thorough analysis and planning of reliability testing for each case when a critical electronic component has to operate at cryogenic tempertures.

A microshutter array (MSA) in the Near-Infrared Spectrograph (NIRSPEC) instrument used in the James Webb Space Telescope (JWST) project will operate at temperatures in the range of 29K to 32K.  A high-voltage driver (HVD) microcircuit used to control the array will be mounted on the MSA board and will also operate at these extremely low temperatures.  This work analyzes reliability hazards of low-temperature conditions, evaluates the possibility of failures caused by different degradation mechanisms in microcircuits, and discusses specifics of HVD operation at cryogenic temperatures.  Performance of different types of ceramic and electrolytic capacitors used for decoupling of power supply signals and/or loading of the outputs at cryogenic conditions is also discussed.  Results of this work are being used to develop a reliability qualification testing plan for the HVD operating at cryogenic conditions.