+ View the NASA Portal NEPP Website Search   Powered By Google Your Path: Home » Parts » Parts Experts   Parts Publications Index   Parts Publications by Area of Emphasis   Parts Links Parts Experts   Parts Manufacturers   Focused Parts Issue Portals & NPSL   GSFC Parts Engineering Resources and Contacts   GSFC Specifications and Qualified Parts List Directory   Search         BACK to Publication List Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors File Name: NEPP report Ta caps 2007 v1.pdf | Date Submitted: 03/10/08   File Size: 1289KB Document Author Alexander Teverovsky - ateverov@pop300.gsfc.nasa.gov GSFC on-site Contractor Phone: 301 286-9691 | FAX: None On File [Additional User Information] Download "Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors" (1289KB) Now.   Description: Reliability Effects of Surge Current Testing of Solid Tantalum Capacitors   Abstract: Solid tantalum capacitors are widely used in space applications to filter low-frequency ripple currents in power supply circuits and stabilize DC voltages in the system. Tantalum capacitors manufactured per military specifications (MIL-PRF-55365) are established reliability components and have less than 0.001% of failures per 1000 hours (the failure rate is less than 10 FIT) for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics.   Related Project(s):   Related Area(s) of Emphasis: Advanced and Emerging Technologies     NEPP Program Manager: Michael J. Sampson Responsible NASA Official: Michael J. Sampson Webmaster: Carl M. Szabo, Jr.       Last Updated: November 29, 2007