+ View the NASA Portal NEPP Website Search   Powered By Google Your Path: Home » Parts » Parts Experts   Parts Publications Index   Parts Publications by Area of Emphasis   Parts Links Parts Experts   Parts Manufacturers   Focused Parts Issue Portals & NPSL   GSFC Parts Engineering Resources and Contacts   GSFC Specifications and Qualified Parts List Directory   Search         BACK to Publication List Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors File Name: Effect_of_SCT_on_reliability.pdf | Date Submitted: 03/27/08   File Size: 502KB Document Author Alexander Teverovsky - ateverov@pop300.gsfc.nasa.gov GSFC on-site Contractor Phone: 301 286-9691 | FAX: None On File [Additional User Information] Download "Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors " (502KB) Now.   Description: CARTS'08 presentation   Abstract:   Related Project(s): EPAR (Electronic Parts)   Related Area(s) of Emphasis: Development of Innovative Qualification Methods Newly Available Technologies and COTS     NEPP Program Manager: Michael J. Sampson Responsible NASA Official: Michael J. Sampson Webmaster: Carl M. Szabo, Jr.       Last Updated: November 29, 2007