Organization/Employer:
Goddard Space Flight Center http://www.gsfc.nasa.gov
NASA/GSFC
Greenbelt, Maryland 20771
301-286-2000
This User is a NEPP Author
Author's Bio:
Kusum K. Sahu is head of the Parts, Packaging, and Assembly Technology Office at GSFC. She has a B.S., M.S., and Ph.D. in Physics from Delhi University in India. She has worked at GSFC since 1982, in areas ranging from performance assurance requirements, to evaluations of microcircuits and semiconductor devices, and radiation damage effects. She has provided technical support to more than 30 NASA projects in components selection and reliability verification testing per military and industry standards for electronic components. She has authored 15 NASA Parts and Components Evaluation reports and more than 400 total dose radiation evaluation reports for GSFC projects including Cassini, EOS, HST, MAP, GOES, SMEX, ISTP, SOHO, and COBE.
Authored Publications: 1. Low Dose Rate Total Ionizing Testing of OP Amps & Data Converters 2. Characterization of Commercial High Density Memories Under Low Dose Rate Total Ionizing Dose 3. Total Ionizing Dose (TID) Evaluation Results of Low Dose Rate Testing 4. Evaluation of the Radiation Tolerance of a 32-bit Microprocessor for Space Applications 5. Low Dose Radiation Testing of Advanced CMOS Technology (AC/ACT) Series Parts for Space Parts Applications 6. NASA/Goddard SRAM (1M Bit) Module Radiation Characterization for Space Applications 7. Evaluation of Actel 1020 and A1280 Field Programmable Gate Arrays 8. Evaluation of the Interpoint DC-DC Converters 9. Evaluation of the Effectiveness of Rescreening for Microcircuits & Semiconductor Devices 10. Reliability & Radiation Sensitivity of Plastic Encapsulated Microcircuits in Space Applications 11.Radiation Report on 80c386-20 Microprocessor 12. Evaluation Report on ZQ04031/62832H Kbit (32kx8 bit) SRAM 13. Evaluation Report on S128k81-55MC 128kx8 SRAM 14. Evaluation on Harris 80c-86, 82c55A, 82c82, 82c84 Microcircuits
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