+ View the NASA Portal NEPP Website Search   Powered By Google Your Path: Home » Parts » Parts Experts   Parts Publications Index   Parts Publications by Area of Emphasis   Parts Links Parts Experts   Parts Manufacturers   Focused Parts Issue Portals & NPSL   GSFC Parts Engineering Resources and Contacts   GSFC Specifications and Qualified Parts List Directory   Search         BACK to Publication List SEU Evaluation of SRAM Memories for Space Applications 2000 NSREC File Name: Sram-00.pdf | Date Submitted: 09/19/01   File Size: 55KB Document Author Leif Scheick - Leif.Z.Scheick@jpl.nasa.gov Jet Propulsion Laboratory Phone: 818 354-3272 | FAX: 818 393-4559 [Additional User Information] Download "SEU Evaluation of SRAM Memories for Space Applications 2000 NSREC" (55KB) Now.   Description:   Abstract: SEU cross-sections were obtained for three different SRAM memories. The 1 Mbit White Electronics WMS128k8, the 256 kbit Austin MT5C2564 and the 256 kbit Austin MT5C2568 SRAMs were tested. The SEU thresholds, respectively were 1 MeV cm2/mg, 1.4 MeV cm2/mg and 1.8 MeV cm2/mg. SEL thresholds were also obtained. These were 37 MeV cm2/mg, 37 MeV cm2/mg and 59 MeV cm2/mg respectively.   Related Project(s): ERC (Electronic Radiation Characterization)   Related Area(s) of Emphasis: High Performance Processor and Memory Technologies Radiation Hardness Assurance     NEPP Program Manager: Michael J. Sampson Responsible NASA Official: Michael J. Sampson Webmaster: Carl M. Szabo, Jr.       Last Updated: November 29, 2007