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Temperature Dependant Dielectric Properties of Polycrystalline 96% Al2O3
File Name: 2004 MRS Fall paper 88011 G7.pdf | Date Submitted: 08/04/05
 

File Size:
67KB
Document Author
Liangyu Chen-Author PI - Liangyu.Chen@grc.nasa.gov
Glenn Research Center
Phone: 216-433-6458 | FAX: 216-433-8000
[Additional User Information]

Download "Temperature Dependant Dielectric Properties of Polycrystalline 96% Al2O3" (67KB) Now.
 
Description:
Temperature Dependant Dielectric Propertiesj of Polycrystalline
 
Abstract:

This article reports temperature dependent dielectric properties of polycrystalline 96% Al2O3 substrates from room temperature to 550°C measured by the AC impedance method from 120 Hz to 1 MHz.  Negative coefficients of volume electrical conductivity between 1 kHz and 100 kHz at room temperature to 50°C and dielectric constant increases with temperature below 10 kHz were found.  The physical mechanisms of these behaviors is discussed.

 
Related Project(s):
EPAC (Electronic Packaging)
 
Related Area(s) of Emphasis:
Extreme Environment Electronics and Packaging
Compound Semiconductor/Microwave Device Technologies
Advanced Interconnect Reliability

 
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