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Task Plan - 04-005 Alternate Approaches for Component Level Testing
File Name: 04-005 1QSR04 Quarterly Review - NEPP'04 Alt Apr_Final.ppt | Date Submitted: 08/19/03
 

File Size:
68KB
Document Author
Ashok Sharma - asharma@pop300.gsfc.nasa.gov
Goddard Space Flight Center
Phone: 301 286-6165 | FAX: 301 286-1695
[Additional User Information]

Download "Task Plan - 04-005 Alternate Approaches for Component Level Testing" (68KB) Now.
 
Description:
Alternate Approaches for Component Level Testing
 
Abstract:
Traditionally, NASA Projects have assured the reliability of EEE parts through intensive screening and qualification test protocols performed at the component level.  Opportunities for cost and/or schedule reduction without sacrificing reliability may be realized through streamlined test flows or evaluation techniques differing from NASA’s traditional tactics (e.g., reduced burn-ins, thermal cycle assessment, switching tests, assembly level testing, etc.). Through this task, a survey will be conducted to identify industry and other practices for assuring component level reliability that may be adapted for NASA’s application needs. Similarly, a survey will be conducted of NASA Programs to determine typical application environments and stresses.  Some preliminary assessment of NASA’s applications vs. industry component assurance practices will be performed. Recommendations will be made for more detailed assessments of practices that show potential to meet NASA's needs. 
 
Related Project(s):
EPAR (Electronic Parts)
 
Related Area(s) of Emphasis:
Development of Innovative Qualification Methods

 
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