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Download "Structure Optimization of Au Wire Wedge-Bond for High Temperature Applications" (169KB) Now.
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Description:
Structure Optimization of Au Wire Wedge-Bond for High Temperature Applications
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Abstract:
The most common failure mode of wirebonds is delamination/cracking at the wire/bond-pad and bond-pad/chip (or substrate) interfaces. A 1-mil Au wire wedge-bonded to an Au bond pad on 96% Al2O3 substrate is examined and modeled using non-linear finite element analysis (FEA). The model was optimized to reduce stress/strain and a plastic strain distribution for the optimized structure was generated.
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Related Project(s):
EPAC (Electronic Packaging)
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Related Area(s) of Emphasis:
Extreme Environment Electronics and Packaging
Compound Semiconductor/Microwave Device Technologies
Advanced Interconnect Reliability
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