Abstract:
Soldering and environmental conditions are often considered as a possible reason of failures of solid tantalum capacitors when it occurs during applications. However, no systematic analysis of factors affecting reliability of contemporary, high CV, tantalum capacitors has been performed. Results of 2007 NEPP task indicated that scintillation and surge current breakdown voltages can be used to assess and predict reliability of solid tantalum capacitors. In this investigation the breakdown voltages as well as other characteristics will be used to evaluate the effect of manual soldering, temperature cycling, and 85 oC/85% RH testing on performance and reliability of high CV capacitors
Related Project(s):
EPAR (Electronic Parts)
Related Area(s) of Emphasis:
Advanced and Emerging Technologies
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