Modern ICs often present challenges for defining appropriate radiation testing parameters due to complexities involved with device packaging. Issues include die (sensitive volume) access and/or particle range for heavy ion single event testing, impact of package on total ionizing dose (TID) characteristics, PEMS/coating effects on linear devices, device thinning and radiation impacts, etc… This task is focused on defining the current state of knowledge, providing recommendations for qualification, and issuing a direction for future work in these areas.