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Task Plan - 04-027 SiC Packaging for Wide Band-Gap Microsystems
File Name: 04-027_GRC_T-8-19_Quad Chart SiC packaging_01-29-04.ppt | Date Submitted: 02/17/04
 

File Size:
243KB
Document Author
Jeannette Plante - jfplante@pop500.gsfc.nasa.gov
Goddard Space Flight Center
Phone: None on File | FAX: None On File
[Additional User Information]

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Description:
 
Abstract:

This task proposes to finish validation of a spark-plug type packaging module for high temperature silicon carbide (SiC) sensors and electronics. SiC has been established as a high temperature electronic and MEMS sensor material. Previously, NEPP supported successful validation of packaging sub-components for high temperature applications. The proposed activity includes integration of these packaging subcomponents to form a multi-purpose packaging module for SiC MEMS sensors with signal conditioning electronics followed by long term reliability validation and relevant aero-propulsion engine environment testing.  The high temperature sensors and electronics enable measurements of acoustic, temperature, pressure, and other physical parameters in high temperature environments, therefore benefiting missions to Venus, space and aero propulsion systems with active control, and launch vehicles.
 
Related Project(s):
EPAC (Electronic Packaging)
 
Related Area(s) of Emphasis:
Advanced and Emerging Technologies
Extreme Environment Electronics and Packaging
Compound Semiconductor/Microwave Device Technologies
MEMS/MOEMs Reliability Assurance

 
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