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TID Radiation Induced Attenuation Testing at 1300 nm Using ISS Requirements on Three Optical Fibers
File Name: ISS-Lucenttestreport.pdf | Date Submitted: 09/19/01
 

File Size:
114KB
Document Author
Melanie Ott - Melanie.N.Ott@nasa.gov
Goddard Space Flight Center
Phone: 301 286-0127 | FAX: 301 286-9778
[Additional User Information]

Download "TID Radiation Induced Attenuation Testing at 1300 nm Using ISS Requirements on Three Optical Fibers " (114KB) Now.
 
Description:
 
Abstract:
The testing of Lucent SFT optical fiber was conducted to characterize several types of the Lucent SFT 100/140/172 carbon coated product for use in a harsh space flight environment.  The environmental parameters used in this testing were extracted from the new International Space Station (ISS) specification 21657 Revision N/C.[1]  The environmental parameters include a constant temperature of -121oC for a maximum of six days during which the fiber is exposed to total ionizing radiation exposure as a result of solar flare events, orbital passes through the South Atlantic Anomaly, and background radiation. The ISS specification requirement includes testing of cable to three different levels of the expected total ionizing dose (TID) in a cold environment. The objective of this testing was to simulate the worst of the actual conditions during a six day cold temperature exposure without over testing. In order to accomplish this, two dose rates were to be used for estimating the radiation induced attenuation performance of the cable, 42 rads/min for two hours to simulate the solar flare activity and .5 rads/min to simulate passes through the South Atlantic Anomaly, SAA and background radiation. The specification requires a TID radiation exposure on the optical fiber cable for a total of six days at a constant temperature of -121oC +/- 4oC. This test was to continue at the second dose rate of exposure, but at room temperature for an additional 48 hours or once a saturation level had been reached for radiation induced attenuation.
 
Related Project(s):
ERC (Electronic Radiation Characterization)
 
Related Area(s) of Emphasis:
Photonic Systems and Devices

 
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