A specific multichip module (MCM) design created by Pico Systems, Inc. was tested for its sensitivity to Electrostatic Discharge or ESD. Testing was performed at NASA/GSFC contractor facilities in Lanham, MD during December 1997. Previously, units of this design had experienced ESD damage at the facilities of a screening subcontractor of Pico Systems Inc. The purpose of this testing was to verify the ESD sensitivity level of the MCM device and assign it a classification level according to military specifications. 

This report summarizes the testing performed and the results achieved. Units remaining from a production lot for a Lockheed-Martin program were the units subjected to testing. Ultimately, the MCM device was proven to be a Class II device per MIL-STD-1686C (Human Body Model or HBM).