+ View the NASA Portal NEPP Website Search   Powered By Google Your Path: Home » Radiation » Radiation Publications Index Radiation Publications Index   Radiation Publications By Area of Emphasis   Radiation Links   Radiation Experts   Search           Project Publications 1. 0607 Xilinx/NASA: Meeting Schedule 2. 0607 Xilinx/NASA: Activities Associated with Working with Xilinx to Develop a Space Flow for Virtex 3. 0607 Xilinx/NASA: Aerospace Status Review (slides) 4. 0607 Xilinx/NASA: Attendance List for GFSC June 26, 2006 Meeting 5. 0607 Xilinx/NASA: Design for Performance Optimization of Virtex Devices (slides) 6. 0607 Xilinx/NASA: FPGA Mission Assurance Center (slides) 7. 0607 Xilinx/NASA: The NASA Electronic Parts and Packaging (NEPP) Program (slides) 8. 0607 Xilinx/NASA: Xilinx Space Heritage (slides) 9. 0607 Xilinx/NASA: Xilinx V4 Single Event Effects (SEE) High-Speed Testing (slides) 10. 0607 Xilinx/NASA: Defense and Aerospace Screening Flows (slides) 11. 0607 Xilinx/NASA: Multi-Bit Upsets in the Virtex Devices (slides) 12. 0607 Xilinx/NASA: Reconfigurable Scalable Computing for Space Applications (slides) 13. 0607 Xilinx/NASA: SpaceCube IRAD Development Effort (slides) 14. 1/f Noise in Proton Irradiated SiGe HBTs 15. 3-D Simulation of Heavy-Ion Induced Charge Collection in SiGe HBTs 16. 3rd NEPP Workshop Program Guide 17. A Comparison of Charge Transfer Efficiency Measure. Techniques on Proton Damaged n-Channel CCD's 18. A Comprehensive Analog SET Analysis Methodology 19. A Model for Single-Event Transients Comparators 2000 NSREC 20. Adaptation of GEANT4 for Single Event Simulations (slides) 21. Advanced Charge Injected Devices for Space Instruments 22. Advanced Sensor Technologies Assessment, Test Techniques and Predictive/Mitigative Methods: Review 23. Agile Input SEU Testing of hte SPT7760 A/D Converter 24. ALTERA STRATIXTM EP1S25 FIELD-PROGRAMMABLE GATE ARRAY (FPGA) 25. An Analysis of Charge Transfer Efficiency Noise on Proton-Damaged CCDs for the HST WFC3 26. An Insider's Guide to Designing Spacecraft Systems and Instruments for Operation in the Natural Spac 27. An Investigation of Proton Energy Effects in SiGe HBT Technology 28. An SEU Hardening Approach for High-Speed SiGe HBT Digital Logic 29. Angular and Energy Dependence of Proton Upset in Optocouplers 1999 NSREC 30. Angular Dependence of DRAM Upset Susceptibility and Implications for Testing and Analysis 2000 NSREC 31. Anomalous Radiation Effects in Fully Depleted SOI MOSFETs Fab'd on SIMOX 32. Application Notes for Analog Linear Devices Regarding Single Event Transients 33. Applications for Fiber Amplifiers For Space: Laser Altimetry and Mapping 34. ASETs and TPA Update 35. Breakdown of Gate Oxides During Irradiation with Heavy Ions 1998 NSREC 36. Broad Beam and Ion Microprobe Studies of Single-Event Upsets in High Speed 0.18 um SiGe HBT Devices 37. Capabilites and Reliability of LEDs and Laser Diodes 38. Carrier Plus: A Sensor Payload for Living With a Star Space Environment Test Bed (LWS/SET) 39. Carrier Plus: A Sensor Payload for Living With a Star Space Environment Test Bed (LWS/SET) (slides 40. Catastrophic Heavy-Ion Failure of a Commercial ASIC 2000 SEE Symposium 41. Catastrophic SEE in High-Voltage Power MOSFETs 42. CCD Radiation Effects and Test Issues for Satellite Designers 43. Changes in Luminescence Emission Induced by Proton Irradiation: InGaAs/GaAs Quantum Wells and Quantu 44. Characteristics of th HST's Rad. Environment Inferred from Charge-Collection Modeling of Near.... 45. Characterization of a Twelve Channel Optical Fiber, Ribbon Cable and MTP Array Connector Assembly... 46. Characterization of Proton Damage in Light-Emitting Diodes 2000 NSREC 47. Characterization of SETs in the LM119 Voltage Comparator 48. Characterization of Transient Error Cross Sections in High Speed Fiber Optic Data Links 49. Charge Collection Analysis and SEU Modeling of SiGe HBTs for High-Speed Digital Logic 50. Circuit Modeling of th LM124 Operational Amplifier for Analog SET Analysis 51. Commercial Microelectronics Technologies for Applications in the Satellite Radiation Environment 52. Commercial off the shelf for LHS experiments.pdf (slides) 53. Comparison of SETs in Bipolar Linear Circuits Gen'd with an Ion Microbeam, Laser Light & Circuitry 54. Comparison of SETs in Bipolar Linear Circuits Generated with an Ion Microbeam, Laser and Circuit Sim 55. Comparison of SETs Induced in an LM124 Op-Amp by Pulsed Laser and a Broad Beam of Heavy Ions 56. Comparison of SETs Induced in an Op Amp LM124 by Pulsed Laser Light and a Broad Beam of Heavy Ions 57. Comparison of SETs Induced in an OpAmp LM124 by Pulsed Laser Light and a Broad Beam of Heavy Ions 58. Comparison of Total Dose Effects on Micropower Op-Amps: Bipolar and CMOS 1998 NSREC 59. Comparison of Total Dose Responses on High Resolution Analog-to-Digital Converters Technologies 1997 60. Comparisons of the Proton-Induced Dark Current and Charge Transfer Efficiency Responses of CCDs 61. Compendium of Single Event Failures in Power MOSFETs 1998 NSREC 62. Continuing Evaluation of Bipolar Linear Devices for Total Dose Bias Dependency and ELDRS Effects 63. COTS #3 Photonics, Optocoupler, Experiment on STRV-1D 64. Current SEE and Radiation Damage Results for Candidate Spacecraft Electronics 65. Degradation of Precision Reference Devices in Space Environments 1997 NSREC 66. Demonstration of SETs Induced by Through-Wafer Two Photon Absorption 67. Device SEE Susceptibility Update 1998 68. Displacement Damage in Bipolar Linear Integrated Circuits 1999 NSREC 69. Dose Rate and Bias Dependency of Total Dose Sensitivity of Low Dropout Volltage Regulators 2000 NSRE 70. Draft Single Event Effects (SEEs) Specification 71. EEE Links January 2003 72. EEE Links Volume 10 No. 2 Apr. 2004 73. Effects of Heavy Ion Exposure on Nanocrystal Nonvolatile Memory 74. Electric Currents through Ion Tracks in Silicon Devices 75. Electron Induced Scintillation Testing of Commercially Available Optical Fibers for Space Flight 76. Electronics Radiation Characterization (ERC) Project – Overview of FY03 77. Emerging Radiation Hardness Assurance (RHA) issues: A NASA approach for space flight programs 78. Enhanced Degradation Resistance of Quantum Dot Lasers to Radiation Damage 79. ERC Roadmap 80. Evaluation of an Ultra Low Power Reed Solomon Encoder for NASA's ST5 Mission 81. Evaluation of an Ultra Low Power Reed Solomon Encoder for NASA's ST5 Mission (slides) 82. Evaluation of Commercial Communication Protocols for Space Application 83. Fiber Optic Cable Assemblies for Space Flight II - Thermal and Radiation Effects (AEIS Conf) 84. Fiber Optic Cable Assemblies for Space Flight II - Thermal and Radiation Effects (JPL Pckg WShp) 85. Final Results for the Photobit Active Pixel Sensor Heavy-Ion Transient Response Test 86. Fiscal Year 2002 NEPP Tasks 87. Flight Data Analysis Report - Seastar and XTE 88. Guidelines for Optocoupler Ground Radiation Testing and Usage in the Space Radiation Environment 89. Hardness Assurance Methodology for Analog SETs (slides) 90. Heavy Ion & Proton Test Results for SiGe CMOS: IBM 5HP and 7HP and Jazz Semiconductor Jazz-120 91. Heavy Ion Broad Beam and Microprobe Studies of SEUs in 0.20 um SiGe HBT Transistors and Circuits 92. Heavy Ion SEE Power Supply for GaAs Power Amplifier TPS9103 93. Heavy Ion SEE Test of 16 bit ADC LTC1608 94. Heavy Ion SEE Test of 16 bit DAC LT1657 95. Heavy Ion SEE Test of Power On Reset LP3470 96. Heavy Ion SEE Test of Switching Regulator LM2651 97. Heavy Ion SEE Test of the 5Ohm Ron SPST Switches ADG452 98. Heavy Ion SEE Test on CMOS Voltage Converter ICL7662 99. Heavy Ion SEE Test on the CMOS Op Amp LMC6484 100. Heavy Ion SEE Test Report for 3 Candidate 22V10 Reprogrammable Logic Devices 101. Heavy Ion SEE Test Report for 4A Adjustable Switch Regulator MSK5042 Run 2 of 2 102. Heavy Ion SEE Test Report for AN10E40 FPAA 103. Heavy Ion SEE Test Results for Temperature Sensor TMP36 104. Heavy Ion SEE Testing of the Intel Pentium III (P3) Microprocessor 105. Heavy Ion SEE Tests of 8 bit ADC AD1175 106. Heavy Ion SEEs Test of LSI Logic 0.18 um G12 Process Logic Chip Test Vehicle 107. Heavy Ion SEEs Test of LSI Logic 0.18 um G12 Process SRAM Test Vehicle 108. Heavy Ion Test Results for Electronic Devices 109. Heavy Ion Testing of Freescale Nano-Crystal Nonvolatile Memory (slides) 110. Heavy Ion Transient and Latch-up Test Results for the OP42 Op Amp 111. Heavy Ion Transient and Latchup Tesing for the LM193A Dual Differential Comparator 112. Heavy Ion Transient Characterization of a Hardened-by-Design Active Pixel Sensor Array 113. Hot Pixel Annealing in the HST Wide Field Camera 3 CCD's 114. Impact of Proton Irradiation on High-Voltage 4H-SiC JBS Switching Diodes 115. Impact of Proton Irradiation on the RF Performance of 0.12 um CMOS Technology 116. Implications of Single Event Effect Characterization of Hybrid DC-DC Converters and a Solid State Po 117. Improved Radiation Qualification & Test Methods for Optical Detector Noise Characterization 118. In-Flight Observations of Multiple-Bit Upset in DRAMs 2000 NSREC 119. Influence of Structural Characteristics on the Response of Si Avalanche Photodiodes to Proton Rad 120. Investigation of Millisecond-Long Analog Single Event Transients in the LM6144 Op Amp 121. Investigation of mSec-long ASETs in Linear Device (slides) 122. Key Proton Test Findings for Sensor Technologies: CID816, HgCdTe, CCD 123. Laser SEE Test Results for AD7414 Temperature Sensor 124. Laser Single Event Effects Test Results for AD7414 Temperature Sensor 125. Laser Testing of CULPRiT RS Encoder and USES Compression Chip 126. Latchup in Integrated Circuits from Energetic Protons 1997 NSREC 127. Latchup Test Conditions for Analog-to-Digital Converters 2000 128. Lessons Learned from Radiation-induced Effects on Solid State Recorders and Memories (report) 129. Lessons Learned from Radiation-induced Effects on Solid State Recorders and Memories (slides) 130. List of Radiation Hardness Assurance References 131. Long SETs in Op Amps (slides) 132. Low-Temperature Electronics for Space & Terrestrial Applications - NEPP Webex Series #2 133. Measurement of the Effective Sensitive Volume of FAMOS Cells of an Ultraviolet Erasable Programmable 134. Microbeam Testing of SiGe HBTs Fabricated in IBM 5HP, 6HP and 7HP 135. Modeling of SEEs in Circuit-Hardened High-Speed SiGe HBT Logic 136. Modeling of Single Event Effects in Circuit-Hardened High-Speed SiGe HBT Logic 137. Modeling Radiation-Induced Transients in the Next Generation Space Telescope (NGST) 138. MPTB AS-1773 FODB Lessons Learned 139. NASA Detector Requirements (slides) 140. NASA Electronic Radiation Characterization Project 141. NASA Electronics Parts & Packaging Program Assurance Research on Optoelectronics 142. NASA Perspective on Radiation Hardness Assurance (RHA) 143. NEPP Conference 2002 Final Program 144. NEPP News Flash - June 2001 145. NEPP News Flash - November 2001 146. NEPP News Flash - October 2002 147. NEPP News Flash - September 2001 148. On the Role of Energy Deposition in Triggering SEGR in Power MOSFETs 1999 NSREC 149. Optical Fiber Cable Assembly Characterization for the Mercury Laser Altimeter (MLA) 150. Parameter Degradation and SEU in Optocouplers in Radiation Environments 151. Phenomenological Application of Target Theory Effects in SEE Analysis 2000 SEE Symp 152. Phonon Production and Nonequalibrium Transport From Ion Strikes 153. Preliminary Heavy Ion SEE Test of ADC 16 bits LTC1605 154. Preliminary Heavy Ion SEE Test Report for CMOS Op-Amp LMC6484 155. Probabilistic Model for Low Altitude Trapped Proton Fluxes 156. Probing Proton Damage in SOI CMOS Technology by Using Lateral Bipolar Action 157. Proton and Heavy Ion SEE Test Results for 12.5 GHz Pseudo-Random Number Generator via IBM 7HP SiGe 158. Proton Damage Effects in Linear Integrated Circuits 1998 NSREC 159. Proton Damage in Linear and Digital Optocouplers 1999 RADECS 160. Proton Degradation in Light-Emitting Diodes 1999 NSREC 161. Proton Displacement Damage in Light-Emitting and Laser Diodes 2000 RADCOTS 162. Proton Induced Transients and Charge Collection Measurements in LWIR HgCdTe Focal Plane Array 163. Proton Induced Transients and Charge Collection Mechanisms in a LWIR HgCdTe Focal Plane Array 164. Proton Irradiation Effects in Oxide-Confined Vertical Cavity Surface Emitting Laser (VCSEL) Diodes 1 165. Proton Radiation Response of SiGe HBT Analog and RF Circuits and Passives 166. Proton Response of 4th Generation 350 GHz UHV/CVD SiGe HBTs 167. Proton SEE Test Results for the Intel Pentium III (P3) Microprocessor 168. Proton SEE Testing of the Myrinet Crossbar Switch and Network Interface Card 169. Proton SEE Testing of the Myrinet Crossbar Switch and Network Interface Card 170. Proton SEE Testing of UT54LVDS217 Serializer 171. Proton SEU Cross Sections Derived from Heavy-Ion Test Data 172. Proton Test Guideline Development - Lessons Learned 173. Proton Test Results for MTX8501/MRX8501 12 x 1.25 Gbps Parallel Array Transmitter and Receiver Modul 174. Proton Testing Guideline Development - Lessons Learned 175. Proton Testing Guidelines Development - Lessons Learned 176. Proton Testing of the AD8151 Cross-Point Switch 177. Proton Tolerance of 3rd Generation, 0.12 um 185 GHz SiGe HBTs 178. Proton Tolerance of Advanced SiGe HBTs Fabricated on Different Substrate Materials 179. Proton Tolerance of Multiple-Threshold Voltage and Multiple-Breakdown Voltage CMOS Device Design 180. Proton Tolerance of Third-Generation 0.12 um 185 GHz SiGe HBT Technology 181. Proton-Induced Bit Error Studies in a 10 Gb/s Fiber Optic Link 182. Proton-Induced Bit Error Studies in a 10 Gb/s Fiber Optic Link (slides) 183. Proton-induced dark current and charge transfer efficiency reponses of n-and p-channel CCD's 184. Pulsed Laser Test of Atmel SpaceWire ASIC 185. Pulsed-Laser Testing Methodology for Single Event Transients in Linear Devices 186. Radiation Damage of Electronic and Optoelectronic Devices in Space 2000 4th Int. WS on Rad Effects 187. Radiation Effect Characterization and Test Methods of Single-Chip and Multi-Chip Stacked 16Mbit DRAM 188. Radiation Effects Data for Commercially Available Optical Fiber: Database Summary 189. Radiation Effects in Advanced Microelectronics Technologies 1997 RADECS 190. Radiation effects in nanostructures: Comparison of proton irradiation induced changes on Quantum Dot 191. Radiation Effects on Advanced Flash Memories 1999 NSREC 192. Radiation Effects on Current Field Programmable Technologies 193. Radiation Effects on Electronics 101: Simple Concepts and New Challenges - NEPP WebEx Series #6 194. Radiation Environment Inferred from Charge Collection Modeling of NICMOS Darkframes 195. Radiation Environment Performance of JWST Prototype FPA's 196. Radiation Environments and Environmental Models - an overview 197. Radiation Evaluation Method for COTS Boards 198. Radiation Hardness Assurance for Space Systems 199. Radiation Hardness of Optical Fiber Presentation to the Space Parts Working Group 200. Radiation Induced Charge Collection in Detector Arrays 201. Radiation Response of a MEMS Accelerometer: An Electrostatic Force 202. Radiation Test Results for Charge Coupled Device CCD486 203. Radiation Test Results for the Pentium III (P3) Microprocessor 204. Radiation Testing of COTS 62.5/125/250 um Optical Fiber 205. Radiation Testing of IEEE 1394 FireWire (presentation) 206. Radiation Testing of IEEE 1394 Firewire (slides) 207. Radiation-Hardened re-programmable Field-Programmable Gate Array (RHrFPGA) 208. Radiation-Inducd Charge Collection in Infrared Detector Arrays 209. Rate Prediction Tool Assessment for SET Errors on Optical Link Receivers and Optocouplers 210. Recent Radiation Damage and SEE Test Results for Candidate Spacecraft Electronics 211. Recent Radiation Damage and Single Event Effect Results For Microelectronics 1999 212. Recent Radiation Damage and Single Event Effects for Candidate Spacecraft Electronics 2001 213. Recent Radiation Test Results at JPL 2003 214. Results for Proton and Neutron Testing of Optical Devices Used in the CIRS Instrument 215. Scaling and Technology Issues for Soft Error Rates 2000 Res Rel 216. SDRAMs: Can't Live With Them, But Can We Live Without Them? 217. SEE & TID Testing of CULPRiT Reed Solomon Encoders 218. SEE And Radiation Damage Results For Candidate Spacecraft Electronics 1998 219. SEE Characteristics of CMOS Devices Employing Various Epi-layer Thicknesses 220. SEE Characterization of the K4F660812 DRAM for ST5 221. SEE Data Analysis of Multiple NASA Spacecraft and Experiments 1995 222. SEE Proton and Heavy Ion Test Results for Candidate Spacecraft Electronics 1994 223. SEE Proton And Heavy Ion Test Results In Support Of Candidate Nasa Programs 1995 224. SEE Test Report on IEEE 1394 225. SEE Test Results For Candidate Spacecraft Electronics 1996 226. SEE Test Results for CandidateSpacecraft Electronics 1996 227. SEE Test Results for CandidateSpacecraft Electronics 1996 228. SEE Testing of an Actel ASIC 229. SEE Testing of the AD8151 Digital Crosspoint Switch 230. SEE Testing of the Intel 80386 Family and the 80486 Microprocessor 231. SEE Testing of the Intel Pentium III (P3) Microprocessor (presentation w/notes) 232. SEEs Induced by Pulsed-Laser Irradiation (slides) 233. SEEs Induced by Two-Photon-Absorption 234. SEL Test Results for IBM 5HP CMOS Ring Oscillator 235. SEL Testing of the AD5334 Digital to Analog Converter 236. Selection and Qualification of Foundries for CMOS Integrated Circuits 237. SET and Destructive SEE Re-Testing of the MDI3051RED12ZF DC-to-DC Converters 238. SET and Destructive SEE Re-Testing of the MDI3051RED15ZF DC-to-DC Converters 239. SET and Destructive SEE Re-Testing of the MDI3051RES05ZF DC-to-DC Converters 240. SET and Destructive SEE Testing of the LTC1149 Step-Down Switching Regulator 241. SET and Destructive SEE Testing of the SG1525A PWM Controller 242. SETs in an LT1128 Op Amp by Heavy Ions 243. SETs in Linear Devices - NASA GSFC Studies (slides) 244. SETs in Linear Devices Testing Guidelines (slides) 245. SETs in Linear Devices, Testing Guidelines (Slides) 246. SETs in LM124 Op Amp Laser Test Report 247. SEU Cross-Section Measurements on High Speed Silicon-on-Sapphire Divide-by-2 Devices 248. SEU Evaluation of SRAM Memories for Space Applications 2000 NSREC 249. SEU Mitigation Testing of Xilinx Virtex II FPGAs 250. SEU Study of Seastar, and the MAP Anomaly (presentation) 251. SEU Test Results for the Xilinx XQ1701L PROM 1999 NSREC 252. SEU Test Results on a Prescalar Fab'd in IBM's 5HP SiGe Heterojunction Bipolar Transistors BiCMOS 253. SEUs in Flash Memories 1997 NSREC 254. SEUs in Optocouplers 1998 NSREC 255. SiGe Radiation Results: Heavy Ion & Proton Effects on Bit Error for HP 7HP and Jazz-120 256. Single Event Effect Criticality Assessment(SEECA) - the SEECA document 257. Space Flight Heritage of Optical Fiber Cables 258. Space Weather Event on the Microwave Anisotropy Probe 259. Space Weather Event on the Microwave Anisotropy Probe (presentation) 260. Spatial and Temporal Characteristics of Energy Deposition by Protons and Alpha Particles in Silicon 261. Spotlight FPGA's: NEPP News Flash - December 2002 262. Spotlight Optical Cable: NEPP News Flash - January 2002 263. Spotlight Radiation Effects: NEPP News Flash - June 2002 264. Summary of the Radiation Testing of the Intel Pentium III (P3) Microprocessor 265. Synopsis V1.1: Heavy Ion-Induced Single Event Effects Measurements on Advanced Analog DC/DC Converte 266. Task Plan - 04-043 Radiation Coordination 267. Task Plan - 04-046 Radiation Guideline COTS Processors 268. Task Plan - 04-047 Board Level Radiation Qualification 269. Task Plan - 04-050 Radiation Effects on COTS Volatile and Non-volatile Memories 270. Task Plan - 04-062 Radiation Impact of Nuclear Propulsion on NASA Missions (New task in FY04) 271. Task Plan - 05-010 Matrix PROM and NAND FLASH SEE Rad 272. Task Plan - 05-043 Radiation Coordination 273. Task Plan - 05-044 ASET & DSET 274. Task Plan - 05-049A Radiation Effects on SiGe Microelectronics – Mixed Signal Technology and Hardening Efforts 275. Task Plan - 05-052a Digital and Mixed Signal ASIC Foundry Radiation Assessments 276. Task Plan - 05-053A Radiation Tolerance for Sensors Technologies 277. Task Plan - 05-078A Reprogrammable FPGA Radiation 278. Task Plan - 06-054bG FPGAs - Volatile - Radiation 279. Task Plan - 06-054bJ FPGAs - Volatile - Radiation 280. Task Plan - 06-076a SeGR in Power MOSFETs - Radiation 281. Task Plan - 06-079 Physics Based Modeling - Radiation 282. Task Plan - 06-080 Scaled CMOS - Radiation 283. Task Plan - 06-082 FPGAs - Non-Volatile - Radiation 284. Task Plan - 06-084G Emerging Non-Volatile Memories - Radiation 285. Task Plan - 06-084J Emerging Non-Volatile Memories - Radiation 286. Task Plan - 06-085G Mass Storage Memories - Radiation 287. Task Plan - 06-085J Mass Storage Memories - Radiation 288. Task Plan - 06-087 Wide Band Gap Devices - Radiation 289. Task Plan - 06-088 High Energy Microbeam Study - Radiation 290. Task Plan - 06-090G Sensor Evaluation - Radiation 291. Task Plan - 06-090J Sensor Technologies - FPA's, Radiation 292. Task Plan - 06-091 Board Level Testing - Radiation 293. Task Plan - 07-040 Non Volatile Memories 294. Task Plan - 07-041 FPGAs 295. Task Plan - 07-042 SDRAMs and SRAMs 296. Task Plan - 07-043 Scaled CMOS 297. Task Plan - 07-044 Radiation Physics Modeling 298. Task Plan - 07-046 Sensor Technologies 299. Task Plan - 07-047 Mixed Signal Hardness Assurance 300. Task Plan - 07-048 301. Task Plan - 07-049 Test Methods Update - SEE 302. Task Plan - 07-113 Reconfigurable FPGA Technology 303. Task Plan - 07-114 TID Effects at Alternating Dose Rates 304. Task Plan - 07-115 305. Task Plan - 07-116 Power MOSFET's 306. Task Plan - 07-117 Sensor Technology CMOS Focal Plane Arrays 307. Task Plan - 07-118 Processor Test Guideline 308. Task Plan - 07-119 SiC in High Radiation Environments 309. Task Plan - 07-120 Radiation Effects Assessment of MRAMs 310. Task Plan - 08-002-2 Photonics 311. Task Plan - 08-160-5 Reconfigurable FPGA Technology 312. Task Plan - 08-161-2 TID Effects at Alternating Dose Rates 313. Task Plan - 08-162-2 Effect of Hydrogen on ELDRS 314. Task Plan - 08-163-4 High-Voltage Power Device Study 315. Task Plan - 08-164-4 Sensor Tech: Commercial Sensor Survey 316. Task Plan - 08-165-2 Processor Test Guideline 317. Task Plan - 08-166-1 Radiation Effects Assesment of MRAM 318. Task Plan - 08-167-1 SiC vs. Si for High Radiation Environments 319. Task Plan - 08-168-1 Radiation Tests of Highly Scaled High Density Commercial Nonvolatile Flash Memories 320. Task Plan - 08-169-1 Pulsed Laser Single Event Latchup Methodology in Advanced CMOS VLSI 321. Task Plan - 08-170-1 Radiation Effects on read cycling/write endurance of MRAM at elevated temperature 322. Task Plan - 08-171-1 ZRAM Radiation Effects Initiative 323. Task Plan - 08-173-1 MRAM Radiation Assessment and Survey 324. Task Plan - 08-173-1 Radiation Tests of Commercial Bridge Chips 325. Task Plan - 08-175-1 Low Temperature Spatially Resolved Digital SET in Deep Submicron CMOS 326. Task Plan - 08-176-1 Failure Mechanisms in High Gain Optical Sensor Technology 327. Task Plan - 08-177-1 Modeling of total dose in aggressively scaled SOI devices 328. Task Plan - 08-178-1 Neutron Irradiation for Latchup Susceptibility Reduction- 329. Task Plan - 08-179-1 Displacement Damaged Low-Temperature Restoration of High Bandwidth Si Optical Sensor Perfor 330. Task Plan - 08-180-1 Radiation Tests of Latchup Mitigation Circuits 331. Task Plan - 08-181-1 Displacement Damage Effects on Single Event Transient Error Rates in Linear Devices 332. Task Plan - 08-182-1 Single Event Latchup Risk Mitigation Trade Analysis 333. Task Plan - 08-183-1 Solar Cell Testing under LILT Conditions 334. Task Plan - 08-184-1 Cooperative Evaluation of RHBD SoC Micro-Processor 335. Task Plan - Assessment of Sensor Tech - ERC FY02 336. Task Plan - Characterization of Ultracapacitors - ERC FY02 337. Task Plan - Development of Improved Radiation Qualification Methods - ERC FY02 338. Task Plan - Emerging CMOS Microelectronics - ERC FY02 339. Task Plan - Emerging Photonic Devices and Data Links - ERC FY02 340. Task Plan - Extension of Flight Project Tests - ERC FY02 341. Task Plan - IPPAQ - High Energy Fac - ERC FY02 342. Task Plan - Rad Qualification for Extreme Environments - ERC FY02 343. Task Plan - Radiation Characterization, Test Techniques, Guidelines for COTS - ERC FY02 344. Task Plan - Radiation effects in new device dielectrics - ERC FY02 345. Task Plan - Radiation Qualification of Hybrid DC/DC switching power converters for Space 346. Task Plan - Radiation Test Guidelines for Optocouplers - ERC FY02 347. Task Plan - Radiation test of SiGe high speed devices - ERC FY02 348. Task Plan - Radiation Websites - ERC FY02 349. Task Plan - Terrestrial Radiation Effects - ERC FY02 350. Technology Readiness Overview: VCSELs 351. Technology Readiness Overview: CMOS Ultra-Low Power Radiation Tolerant (CULPRiT) Integrated Circuits 352. Test Methodology for Characterizing SEE Response of a Commercial IEEE 1394 Serial Bus (FireWire) 353. Test Methodology for SET in Linear Devices 354. Testing and Hardness Assurance Guidelines for SETs in Linear Devices 355. The Effect of Radiation Type on the Tolerance of High Power 4H-SiC Diodes 356. The Effects of Ionizing Radiation on Wearout and Reliability of Thin Gate Oxides 2000 MRQ 357. The Effects of Proton Irradiation on SiGe:C HBTs 358. The Effects of Radiation on 1/f Noise in Complementary (npn+pnp) SiGe HBTs 359. The Effects of Space Radiation on Linear Integrated Circuits 2000 Aerospace Conference 360. The Impact of System Configuration on Device Radiation Damage Testing of Optical Components 361. The Inaugural SEE Run for the NSCL SEE Test Facility (slides) 362. The Influence of Variations of Diffusion Length on Charge Collected by Diffusion from Ion Tracks 363. The NASA Electronics Radiation Characterization Project 364. The Role of Parasitic Elements in the SET Response of Linear Circuits 365. TID and SEE Test Results for the Intel Pentium III and AMD K7 Microprocessors 366. TID and SEE Test Results for the Intel Pentium III and AMD K7 Microprocessors: an update (slides) 367. TID Radiation Induced Attenuation Testing at 1300 nm Using ISS Requirements on Three Optical Fibers 368. TID Steady-State Irradiation of 0.18 um G12 Process SRAM Test Vehicle from LSI Logic 369. TID Test Report for a P-Channel MOSFET IRLML5103A 370. TID Test Report for a P-Channel MOSFET NDS352AP 371. TID Test Report for an N-Channel MOSFET IRLML2803A 372. TID Test Results for a N-Channel MOSFET FDN361AN 373. TID Testing Results for A-to-D Converter (DAC) AD5334 374. TID Tolerance of Monolithic mm-Wave Transceiver Building Blocks Implemented in 200 GHz SiGe Process 375. TID, SEE and Radiation Induced Failures in Advanced Flash Memories 376. Total Dose Degradation of MEMS Optical Mirrors 377. Total Ionizing Dose Effects on 64-Mb, 3.3 V DRAMs 1997 NSREC 378. Total Ionizing Dose Effects on Flash Memories 1998 NSREC 379. Total Ionizing Dose Testing of the Intel Pentium III (P3) and AMD K7 Microprocessors 380. Trip Report and Preliminary Test Results for 10 Gbps OMNET Flyable Link Proton Tests 381. Update on TID and SEE Testing of the Pentium III (P3) and AMD K7 Microprocessors 382. Using Proton Irradiation to Probe the Origins of Low-f Noise Variations in SiGe HBTs   NEPP Program Manager: Michael J. Sampson Responsible NASA Official: Michael J. Sampson Webmaster: Carl M. Szabo, Jr.       Last Updated: August 29, 2008