%PDF-1.6
%
3 0 obj
<>
endobj
142 0 obj
<>stream
application/pdf
Martha V. O’Bryan, Kenneth A. LaBel, Robert A. Reed, Jim W. Howard, Janet L. Barth,Christina M. Seidleck, Paul W. Marshall, Cheryl J. Marshall, Hak S. Kim,Donald K. Hawkins, Martin A. Carts, and Kurt E. Forslund
RECENT RADIATION DAMAGE AND SINGLE EVENT EFFECT RESULTS FOR MICROELECTRONICS
RADIATION DAMAGE
SEE
RESULTS
MICROELECTRONICS
GSFC
IEEE
LEET NSCL
1999-07-26T14:34:56Z
2011-07-05T12:03:54-04:00
2011-07-05T12:03:54-04:00
RADIATION DAMAGE, SEE, RESULTS, MICROELECTRONICS, GSFC, IEEE, LEET NSCL
Acrobat PDFWriter 3.02 for Windows NT
uuid:875dc633-58e5-41f3-9f19-4eefe680af97
uuid:f19fc821-c0c7-49ed-87f3-0d1b76174b2f
endstream
endobj
133 0 obj
<>
endobj
5 0 obj
<>
endobj
56 0 obj
<>
endobj
55 0 obj
<>/ProcSet 2 0 R/XObject<>>>/Type/Page>>
endobj
67 0 obj
<>/ProcSet 2 0 R/XObject<>>>/Type/Page>>
endobj
82 0 obj
<>/ProcSet 2 0 R/XObject<>>>/Type/Page>>
endobj
89 0 obj
<>/ProcSet 2 0 R/XObject<>>>/Type/Page>>
endobj
102 0 obj
<>/ProcSet 2 0 R>>/Type/Page>>
endobj
139 0 obj
<>/ProcSet[/PDF/Text]>>/Type/Page>>
endobj
108 1 obj
<>/ProcSet 112 1 R/XObject<>>>/Type/Page>>
endobj
125 1 obj
<>/ProcSet 112 1 R>>/Type/Page>>
endobj
122 1 obj
<>stream
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