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Christian Poivey, George Gee, Janet Barth, Ken LaBel, Harvey Safren
Lessons Learned from Radiation Induced Effects on Solid State Recorders (SSR) and Memories
Solid State Recorders (SSR) and Memories
Radiation Induced
Effects
SSR
Memories
2002
GSFC
2003-12-17T19:16:01Z
Microsoft Word - 2002_SSR.doc
2011-06-24T14:11:01-04:00
2011-06-24T14:11:01-04:00
Acrobat PDFWriter 4.05 for Windows NT
Radiation Induced, Effects, SSR, Memories, 2002, GSFC
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11.25 0 TD 0.1418 Tc -0.1043 Tw (Dufour & al., \223Heavy ion induced single hard errors on ) Tj
224.25 0 TD 0.1313 Tc -0.0688 Tw (submicronic memories,\224 IEEE Trans.) Tj
-235.5 -12 TD 0.0173 Tc -0.2048 Tw (Nuc. ) Tj
21 0 TD 0.1329 Tc -0.3204 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 39, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.0679 Tc 0.1196 Tw (6, pp. 1693-1697, Dec. 92.) Tj
-117 -11.25 TD -0.1234 Tc 0 Tw ([32]) Tj
36 0 TD 0.1352 Tc -0.162 Tw (T.R. Oldham & al., \223Total dose failures in advanced electronics from single ions,\224 IEEE Trans.) Tj
0 -12.75 TD 0.0173 Tc -0.2048 Tw (Nuc. ) Tj
21 0 TD 0.1329 Tc -0.3204 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 40, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.0679 Tc 0.1196 Tw (6, pp. 1820-1830, Dec. 93.) Tj
-117 -12 TD -0.1234 Tc 0 Tw ([33]) Tj
36 0 TD 0.1501 Tc -0.284 Tw (G.M. Swift & al., \223A new class of single event hard errors,\224 IEEE Trans. ) Tj
294 0 TD 0.2048 Tc 0.3577 Tw (Nuc. ) Tj
21.75 0 TD 0.1329 Tc 0.4296 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 39, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
-0.2813 Tc (6,) Tj
-375.75 -11.25 TD 0.0653 Tc -0.0028 Tw (pp. 1804-1808, Dec. 92.) Tj
-36 -12 TD -0.1234 Tc 0 Tw ([34]) Tj
36 0 TD -0.2385 Tc 0.051 Tw (K. ) Tj
12 0 TD 0.1528 Tc -0.2903 Tw (LaBel & al., \223SEU tests of a 80386 based flight computer/data handling system and of discrete) Tj
-12 -11.25 TD 0.1442 Tc -0.1586 Tw (PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and) Tj
0 -11.25 TD 0.086 Tc 0.1015 Tw (ASICs,\224 1992 IEEE Radiation Effects Data Workshop proceedings, pp 1-11, 1992.) Tj
-36 -12 TD -0.1234 Tc 0 Tw ([35]) Tj
36 0 TD 0.1194 Tc -0.1194 Tw (C. Poivey & al., \223SEP characterization of 1M ) Tj
184.5 0 TD 0.1468 Tc -0.0843 Tw (EEPROMs from SEEQ and Hybrid Memory,\224 1994) Tj
-184.5 -11.25 TD 0.1299 Tc -0.1299 Tw (IEEE Radiation Effects Data Workshop proceedings, pp 20-25, 1994.) Tj
-36 -11.25 TD -0.1234 Tc 0 Tw ([36]) Tj
36 0 TD 0.0296 Tc 0.5329 Tw (R. ) Tj
11.25 0 TD 0.1446 Tc -0.4258 Tw (Harboe Sorensen, R. Muller, \223Radiation testing of UV ) Tj
220.5 0 TD 0.1023 Tc 0.4602 Tw (EPROMs, flash ) Tj
66 0 TD 0.1988 Tc -0.3863 Tw (EPROMs and) Tj
-297.75 -12 TD 0.1149 Tc -0.0881 Tw (EEPROMs for space applications,\224 ESA report ESA-QCA0076TS, 1996.) Tj
-36 -11.25 TD -0.1234 Tc 0 Tw ([37]) Tj
36 0 TD -0.1793 Tc -0.0082 Tw (P. ) Tj
10.5 0 TD 0.1261 Tc -0.1636 Tw (Dressendorfer, \223An overview of advanced non volatile memory technologies,\224 1991 IEEE) Tj
-10.5 -11.25 TD 0.1251 Tc -0.3126 Tw (NSREC short course, 1991.) Tj
-36 -12 TD -0.1234 Tc 0 Tw ([38]) Tj
36 0 TD 0.0107 Tc -0.1982 Tw (J.A. ) Tj
18 0 TD 0.1302 Tc -0.1447 Tw (Zoutendyk & al., \223Characterization of Multiple Bit errors from single ion tracks in integrated) Tj
-18 -12 TD 0.1386 Tc -0.3261 Tw (circuits,\224 IEEE Trans. ) Tj
90.75 0 TD 0.0173 Tc -0.2048 Tw (Nuc. ) Tj
21 0 TD 0.1329 Tc -0.3204 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 36, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.0679 Tc 0.1196 Tw (6, pp. 2267-2274, Dec. 89.) Tj
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301.5 38.25 TD
0 0 0 rg
/F0 9.75 Tf
-0.375 Tc 0 Tw (23) Tj
-211.5 672.75 TD 0.1429 Tc 0.6279 Tw (the orbit where the spacecraft is outside the trapped proton belt. However, in case of large SPE the SEU) Tj
0 -12 TD 0.1929 Tc -0.2867 Tw (rate may also be very high outside the SAA.) Tj
0 -36.75 TD /F5 12 Tf
-0.2376 Tc 0 Tw (5.3.2) Tj
26.25 0 TD 0 Tc -0.336 Tw ( ) Tj
9.75 0 TD 0.0025 Tc -0.3385 Tw (Other single events) Tj
-36 -15 TD /F0 9.75 Tf
0.1616 Tc -0.0844 Tw (Use of devices not sensitive to SEL, SEFI, SEGR and SHE is recommended. In SSR applications, because) Tj
0 -11.25 TD 0.1829 Tc 0.201 Tw (of the large number of devices used, there is always the risk of such an event. It is recommended to use a) Tj
T* 0.1327 Tc -0.2265 Tw (flexible design, with current limitations, and the possibility to power cycle and reinitialize. The use of spare) Tj
0 -12 TD 0.1681 Tc 0.9075 Tw (memory is also useful in case of permanent failure of some parts of the memory array due to SEGR or) Tj
0 -11.25 TD 0.0796 Tc -0.2671 Tw (destructive SEL.) Tj
0 -39 TD /F3 14.25 Tf
0.327 Tc 0 Tw (6) Tj
8.25 0 TD 0 Tc -0.2115 Tw ( ) Tj
13.5 0 TD -0.1377 Tc 0 Tw (Conclusions) Tj
-21.75 -15 TD /F0 9.75 Tf
0.1571 Tc 0.9554 Tw (COTS memories have been flown with success the last ten years. Memory experiments have been very) Tj
0 -12 TD 0.1408 Tc 0.7551 Tw (useful to check the behavior of these parts in space. It is very important because the MBU sensitivity is) Tj
0 -11.25 TD 0.1778 Tc -0.3653 Tw (difficult to test accurately at ground.) Tj
T* 0.0404 Tc 1.7721 Tw (State-of-the-art memories, like ) Tj
132 0 TD 0.1088 Tc 2.2037 Tw (SDRAMs, are becoming more and more complex, and therefore more) Tj
-132 -12 TD 0.1284 Tc 2.1341 Tw (difficult to test and more sensitive to radiation effects. New flight experiments on these devices are) Tj
0 -11.25 TD 0.1457 Tc 1.4315 Tw (essential to \223secure\224 the use of these devices in future applications. The flight data has shown that is) Tj
T* 0.1667 Tc -0.3542 Tw (important to have accurate information about the shielding, and the solar particle flux to study the effects of) Tj
0 -12 TD 0.1554 Tc -0.3035 Tw (SPE. As no information is available for solar heavy ions, it is useful to fly a detector with the experiments.) Tj
0 -38.25 TD /F3 14.25 Tf
0.327 Tc 0 Tw (7) Tj
8.25 0 TD 0 Tc -0.2115 Tw ( ) Tj
13.5 0 TD -0.0322 Tc 0 Tw (References) Tj
-21.75 -27 TD /F0 9.75 Tf
0.2105 Tc ([1]) Tj
36 0 TD 0.1365 Tc 0.051 Tw (K. A. ) Tj
24.75 0 TD 0.0891 Tc -0.1516 Tw (LaBel & al., \223Solid State Recorders: ) Tj
147.75 0 TD 0.1135 Tc -0.051 Tw (Spaceflight SEU Data for SAMPEX and TOMS/) Tj
-172.5 -11.25 TD 0.1074 Tc 0.0801 Tw (Meteor-3,\224 1993 IEEE Radiation Effects Data Workshop proceedings, ) Tj
285 0 TD 0 0 1 rg
0.1139 Tc -0.3014 Tw (pp 1964-1971) Tj
54.75 0 TD 0 0 0 rg
-0.0625 Tc 0.625 Tw (, 1994.) Tj
-375.75 -12 TD 0.2105 Tc 0 Tw ([2]) Tj
36 0 TD 0.051 Tc 0.5115 Tw (C.M. ) Tj
22.5 0 TD 0.1382 Tc -0.0757 Tw (Seidleck & al., \223Single Event Effect Flight Data Analysis ) Tj
233.25 0 TD 0.1213 Tc -0.1588 Tw (of Multiple NASA Spacecraft and) Tj
-255.75 -11.25 TD 0.1467 Tc -0.2508 Tw (Experiments; Implications to Spacecraft Electrical Designs,\224 RADECS 1995 Proceedings, pp.) Tj
0 -11.25 TD 0.0099 Tc 0.5526 Tw (581-588, 1996.) Tj
-36 -12 TD 0.2105 Tc 0 Tw ([3]) Tj
36 0 TD 0.131 Tc -0.1578 Tw (C.I. Underwood & al., \223Observations of Single Event Upset and Multiple Bit Upset in Non) Tj
0 -11.25 TD 0.1386 Tc 0.0489 Tw (Hardened High-Density ) Tj
98.25 0 TD 0.1218 Tc -0.1218 Tw (SRAMs in the TOPEX/Poseidon Orbit,\224 1993 IEEE Radiation Effects) Tj
-98.25 -11.25 TD 0.1095 Tc -0.147 Tw (Data Workshop proceedings, pp 85-92, 1994.) Tj
-36 -12 TD 0.2105 Tc 0 Tw ([4]) Tj
36 0 TD -0.0937 Tc -0.0938 Tw (C.I. ) Tj
17.25 0 TD 0.0945 Tc 0.0394 Tw (Underwood , \223The Single-Event-Effect Behavior of Commercial-Off-The-Shelf Memory) Tj
-17.25 -11.25 TD 0.1065 Tc -0.0212 Tw (Devices-A Decade in Low-Earth Orbit,\224 ,\224 RADECS 1997 Proceedings, pp. 251-258, 1998.) Tj
-36 -11.25 TD 0.2105 Tc 0 Tw ([5]) Tj
36 0 TD 0.1037 Tc -0.0412 Tw (C.I. Underwood & al., \223Observed Radiation-Induced Degradation of Commercial-Off-The Shelf) Tj
0 -12.75 TD 0.1103 Tc -0.0165 Tw (\(COTS\) Devices Operating in Low-Earth Orbit,\224 IEEE Trans. ) Tj
250.5 0 TD 0.0173 Tc -0.2048 Tw (Nuc. ) Tj
21 0 TD 0.1329 Tc -0.3204 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 45, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.1253 Tc -0.3128 Tw (6, pp. 2737-) Tj
-331.5 -11.25 TD -0.0425 Tc 0.605 Tw (2744, Dec. 98.) Tj
-36 -11.25 TD 0.2105 Tc 0 Tw ([6]) Tj
36 0 TD 0.0321 Tc 0.5304 Tw (C.I. Unde) Tj
39 0 TD 0.1284 Tc -0.1795 Tw (rwood & al., \223Observations on the Reliability of COTS-Device-Based Solid State Data) Tj
-39 -12 TD 0.1293 Tc -0.1123 Tw (Recorders Operating in Low Earth Orbit,\224 RADECS 1999 Proceedings, pp. 387-393, 2000.) Tj
-36 -11.25 TD 0.2105 Tc 0 Tw ([7]) Tj
36 0 TD 0.142 Tc -0.267 Tw (E.G. Mullen & al., \223SEU Results from the Advanced Photovoltaic and Electronics Expe) Tj
352.5 0 TD 0.1071 Tc 0 Tw (riments) Tj
-352.5 -12 TD 0.1043 Tc -0.1043 Tw (\(APEX\) Satellite,\224 IEEE Trans. ) Tj
129 0 TD 0.2048 Tc 0.3577 Tw (Nuc. ) Tj
21.75 0 TD 0.1329 Tc 0.4296 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 42, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.102 Tc 0.0855 Tw (6, pp. 1988-1994, Dec. 95.) Tj
-246.75 -12 TD 0.2105 Tc 0 Tw ([8]) Tj
36 0 TD 0.0296 Tc 0.5329 Tw (R. ) Tj
11.25 0 TD 0.1445 Tc -0.2639 Tw (Harboe-Sorensen & al., \223Observation and Analysis of Single Event Effects On-board the) Tj
-11.25 -11.25 TD 0.096 Tc 0.0165 Tw (SOHO Satellite,\224 RADECS 2001 proceedings, 2001.) Tj
-36 -12 TD 0.2105 Tc 0 Tw ([9]) Tj
36 0 TD -0.0724 Tc -0.1151 Tw (T. ) Tj
11.25 0 TD 0.1074 Tc -0.0904 Tw (Goka & al., \223SEE Flight Data from Japanese Satellites,\224 IEEE Trans. ) Tj
279 0 TD 0.2048 Tc 0.3577 Tw (Nuc. ) Tj
21.75 0 TD 0.1329 Tc 0.4296 Tw (Sci., ) Tj
20.25 0 TD -0.039 Tc 0.2265 Tw (vol 45, n) Tj
35.25 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.3 Tc -0.4875 Tw (6, pp.) Tj
-372 -12 TD 0.0437 Tc 0.1438 Tw (2771-2778, Dec. 98.) Tj
-36 -11.25 TD -0.1234 Tc 0 Tw ([10]) Tj
36 0 TD 0.0296 Tc 0.5329 Tw (R. ) Tj
12 0 TD 0.1242 Tc -0.1386 Tw (Ecoffet & al., \223Influence of Solar Cycle on SPOT1-2-3 Upset Rates,\224 IEEE Trans. ) Tj
332.25 0 TD 0.0173 Tc -0.2048 Tw (Nuc. ) Tj
21 0 TD 0.2829 Tc 0 Tw (Sci.,) Tj
-365.25 -12 TD -0.039 Tc -0.1485 Tw (vol 42, n) Tj
34.5 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
4.5 0 TD /F0 9.75 Tf
0.0679 Tc 0.1196 Tw (6, pp. 1983-1987, Dec. 95.) Tj
-75 -12 TD -0.1234 Tc 0 Tw ([11]) Tj
36 0 TD -0.0938 Tc -0.0938 Tw (J.L. ) Tj
17.25 0 TD 0.1515 Tc -0.2557 Tw (Barth & al., \223Single Event Upset Rates on 1 ) Tj
178.5 0 TD 0.1832 Tc -0.1207 Tw (Mbit and 256 ) Tj
56.25 0 TD 0.1051 Tc 0.2074 Tw (Kbit Memories: CRUX Experiment) Tj
-252 -12 TD 0.1261 Tc -0.1261 Tw (on APEX,\224 IEEE Trans. ) Tj
99.75 0 TD 0.0173 Tc -0.2048 Tw (Nuc. ) Tj
21.75 0 TD -0.0171 Tc -0.1704 Tw (Sci., ) Tj
19.5 0 TD 0.1753 Tc -0.3628 Tw (vol 42, n) Tj
36 0 TD /F6 9.75 Tf
-0.15 Tc 0 Tw (\260) Tj
3.75 0 TD /F0 9.75 Tf
0.102 Tc -0.102 Tw (6, pp. 1964-1974, Dec. 95.) Tj
-216.75 -11.25 TD -0.1234 Tc 0 Tw ([12]) Tj
36 0 TD -0.1151 Tc -0.0724 Tw (J. ) Tj
8.25 0 TD 0.143 Tc -0.1574 Tw (Adolphsen & al., \223SEE Data from the APEX Cosmic Ray Upset Experiment: Predicting the) Tj
-8.25 -12 TD 0.1195 Tc -0.0343 Tw (Performance of Commercial Devices in Space,\224 RADECS 1995 Proceedings, pp. 572-580, 1996.) Tj
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BT
301.5 38.25 TD
0 0 0 rg
/F0 9.75 Tf
-0.375 Tc 0 Tw (22) Tj
-211.5 669 TD /F3 14.25 Tf
0.327 Tc (5) Tj
8.25 0 TD 0 Tc -0.2115 Tw ( ) Tj
13.5 0 TD -0.1487 Tc 0 Tw (Recommendations) Tj
-21.75 -30 TD /F4 12 Tf
-0.31 Tc (5.1) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD 0.0448 Tc 0.3692 Tw (Ground testing) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1631 Tc -0.3089 Tw (An accurate heavy ion and proton SEE characterization is essential to assess the in flight SEE risk. The best) Tj
0 -12 TD 0.1471 Tc 0.4154 Tw (accuracy is obtained when testing is done on parts coming from the flight lot. The sample size is also an) Tj
0 -11.25 TD 0.1426 Tc -0.1977 Tw (important factor. Generally, because of the cost of particle accelerators, the SEE tests are performed on 2 to) Tj
T* 0.1658 Tc 0.0438 Tw (3 parts. This gives poor test fidelity. Assuming that SEE sensitivity on memory device follows a binomial) Tj
0 -12 TD 0.1252 Tc -0.0627 Tw (law, it is necessary to test 23 parts to get a sensitivity which will not be exceeded with a probability of 90%) Tj
0 -11.25 TD 0.137 Tc 1.1755 Tw (and a confidence level of 90%. It is important to test the parts not only for SEU, ) Tj
347.25 0 TD 0.2483 Tc 1.2517 Tw (but for all the other) Tj
-347.25 -11.25 TD 0.1514 Tc 0.6254 Tw (potential sensitivities: SMU, SHE, SEFI, and SEL. Generally the statistics, and therefore the accuracy of) Tj
0 -12 TD 0.1509 Tc -0.3384 Tw (these tests is poor.) Tj
0 -11.25 TD 0.1543 Tc 1.2654 Tw (An accurate TID characterization is also important, when the sensitivity is evaluated, the mission dose) Tj
T* 0.1199 Tc 0.2662 Tw (levels on memories should be kept to a level where no significant degradation is observed. It is essentially) Tj
0 -12 TD 0.0803 Tc 0.4822 Tw (important for ) Tj
58.5 0 TD 0.1647 Tc 1.3621 Tw (SSRs applications where a small increase of power supply current on a large number of) Tj
-58.5 -11.25 TD 0.1556 Tc -0.2749 Tw (devices may lead to a significant increase of the SSR supply current.) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (5.2) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD -0.0094 Tc -0.0766 Tw (SEE error rate calculation) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1352 Tc 0.6004 Tw (With an accurate heavy and proton characterization, use of the adequate environment models, reasonable) Tj
0 -11.25 TD 0.1572 Tc 0.6865 Tw (assumptions on the sensitive volume thickness, the flight SEU rates will be estimated within an order of) Tj
0 -12 TD 0.1389 Tc -0.3264 Tw (magnitude for the background radiation environment.) Tj
0 -11.25 TD 0.1617 Tc 0.2035 Tw (As shown by the flight data, an orbit average rate does not correspond to the reality where the majority of) Tj
T* 0.1723 Tc 1.2235 Tw (SEUs occur in bursts \(very high rate during a short period of time\). These maximum rates need to be) Tj
0 -12 TD 0.1396 Tc 0 Tw (calculated.) Tj
0 -11.25 TD 0.1619 Tc -0.2958 Tw (The SPE environment models will give conservative estimates of the SEU rates during solar events.) Tj
0 -23.25 TD 0.1021 Tc -0.1021 Tw (For the other events such as SEL, SEFI, SEGR) Tj
187.5 0 TD 0.1313 Tc 0.0221 Tw (,.., the accuracy of the prediction will be very poor. SEL and) Tj
-187.5 -11.25 TD 0.2056 Tc 1.2944 Tw (SEFI rate calculation assuming only one sensitive volume of area the device SEL cross section and a) Tj
0 -11.25 TD 0.1533 Tc 0.8063 Tw (thickness of 2 um will give a conservative estimate of the flight rates. For SMU rates calculations these) Tj
0 -12 TD 0.1235 Tc 0.4926 Tw (assumptions will lead to unrealistically high estimations of the SMU rates and considering every memory) Tj
0 -11.25 TD 0.1706 Tc 0.9213 Tw (cell as a sensitive volume will underestimate the SMU rate. For these events we recommend to apply a) Tj
T* 0.1206 Tc -0.3081 Tw (higher design margin than for SEU.) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (5.3) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD -0.0019 Tc -0.3341 Tw (SEE mitigation scheme) Tj
-28.5 -28.5 TD /F5 12 Tf
-0.2376 Tc 0 Tw (5.3.1) Tj
26.25 0 TD 0 Tc -0.336 Tw ( ) Tj
9.75 0 TD 0.072 Tc -0.408 Tw (SEU and MBU) Tj
-36 -15 TD /F0 9.75 Tf
0.1536 Tc 0.4972 Tw (EDAC techniques work well to mitigate SEU. Hamming code will fail in case of SMU. The obvious and) Tj
0 -11.25 TD 0.1623 Tc -0.1292 Tw (well-known solution to deal with SMU on single bit correction codes is to simply rearrange the memory so) Tj
T* 0.1353 Tc -0.1978 Tw (that it is constructed from devices ) Tj
137.25 0 TD 0.1617 Tc 0.4008 Tw (with a \223x1 bit\224 architecture. With such an architecture multiple bit flips) Tj
-137.25 -12 TD 0.1461 Tc -0.1572 Tw (within a device will be spread across several data words, thus causing no difficulty with the Hamming code) Tj
0 -11.25 TD 0.1123 Tc 1.0848 Tw (EDAC system. Unfortunately recent memories are not available with x1 bit architecture, therefore using) Tj
T* 0.1375 Tc 0.7014 Tw (only one bit per memory device to form a data word will require a large memory overhead or a complex) Tj
0 -12 TD 0.1561 Tc 0.9196 Tw (design. Another solution is the use of a modified Hamming code capable of correcting 2 bits in a data) Tj
0 -11.25 TD 0.1553 Tc 0 Tw (word.) Tj
T* 0.1778 Tc 0.1764 Tw (For LEO orbits the data shows that the SEU occur in bursts when the spacecraft goes through the trapped) Tj
0 -12 TD 0.1566 Tc -0.2418 Tw (proton belts. For example, on a LEO polar orbit, 80% of the SEU occur in the SAA in bursts lasting for 5 to) Tj
0 -11.25 TD 0.1372 Tc -0.2122 Tw (10 minutes per orbit. The scrubbing rate needs to be calculated for this high SEU rate. On the other hand, in) Tj
T* 0.1423 Tc -0.3298 Tw (the absence of SPE, the ) Tj
96 0 TD 0.1365 Tc -0.324 Tw (number of ) Tj
44.25 0 TD 0.1948 Tc 0.0793 Tw (SEUs that occur outside the SAA are so small that they can be ignored.) Tj
-140.25 -12 TD 0.154 Tc -0.3415 Tw (If the scrubbing rate ) Tj
83.25 0 TD 0.1587 Tc -0.3021 Tw (is longer than the time taken to pass through the trapped proton belt, it would be just as) Tj
-83.25 -11.25 TD 0.1361 Tc 0.0293 Tw (effective to make the scrubbing rate equal to the orbital period. If the scrubbing rate is substantially shorter) Tj
0 -11.25 TD 0.1732 Tc -0.0055 Tw (than the time taken to pass through the trapped proton belt, the scrubbing may be suspended for the rest of) Tj
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BT
301.5 38.25 TD
0 0 0 rg
/F0 9.75 Tf
-0.375 Tc 0 Tw (21) Tj
-211.5 669 TD /F3 14.25 Tf
0.327 Tc (4) Tj
8.25 0 TD 0 Tc -0.2115 Tw ( ) Tj
13.5 0 TD -0.1428 Tc -0.0687 Tw (Lessons learned) Tj
-21.75 -30 TD /F4 12 Tf
-0.31 Tc 0 Tw (4.1) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD 0.0814 Tc -0.4174 Tw (SEU rate) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1461 Tc 0.1006 Tw (The main lesson learned is that there is large SEU sensitivity range from device to device type, and part to) Tj
0 -12 TD 0.1438 Tc 0.252 Tw (part for the same device type. There is also a large variation of sensitivity depending on the environment.) Tj
0 -11.25 TD 0.1362 Tc 0.6469 Tw (When the flown device has been characterized both to heavy ion and protons, the calculated SEU rate is) Tj
T* 0.128 Tc 0.7158 Tw (generally in good agreement with the observed average flight rate \(within an order of magnitude\) for the) Tj
0 -12.75 TD 0.1462 Tc 0.2556 Tw (background environment. However, the standard assumption of a thin sensitive volume thickness of 2 ) Tj
419.25 0 TD /F6 9.75 Tf
-0.366 Tc 0 Tw (m) Tj
6 0 TD /F0 9.75 Tf
-0.0855 Tc (m) Tj
-425.25 -11.25 TD 0.1284 Tc 1.077 Tw (is too conservative for some devices, especially ) Tj
204 0 TD 0.1659 Tc 1.8966 Tw (DRAMs. It should also be noted that, despite all the) Tj
-204 -11.25 TD 0.1145 Tc 1.1403 Tw (conservative assumptions made for the predictions, these predictions are not always pessimistic. This is) Tj
0 -12 TD 0.1235 Tc -0.2277 Tw (generally the result of inaccurate test data, or inaccurate ) Tj
226.5 0 TD 0.1227 Tc -0.3102 Tw (modelization of the radiation environment.) Tj
-226.5 -11.25 TD 0.1318 Tc 2.52 Tw (The SPE CREME96 standard models \(peak event, worst day, and worst week\) give generally very) Tj
0 -11.25 TD 0.1196 Tc -0.3071 Tw (conservative values of the upset rates during a SPE.) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (4.2) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD -0.108 Tc 0 Tw (MBU) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1307 Tc 0.5108 Tw (Flight data shows that the MBU rate is significant \(up to 20% of the total event rate\). SMU are generally) Tj
0 -12 TD 0.1558 Tc 0.7817 Tw (detected during ground testing, but it is generally difficult to quantify accurately the risk because of the) Tj
0 -11.25 TD 0.0955 Tc -0.0687 Tw (large anisotropy of the mechanisms involved [19, 39]) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (4.3) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD 0.2685 Tc 0 Tw (SEFI) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1519 Tc -0.0581 Tw (SEFI events have been observed on flight on memories. Because of the low \(but not negligible\) sensitivity,) Tj
0 -11.25 TD 0.1585 Tc -0.346 Tw (these types of events can be incorrectly characterized during ground testing of a small number of parts.) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (4.4) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD 0.276 Tc 0 Tw (SHE) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.2083 Tc 0.8542 Tw (SHEs due to ) Tj
57 0 TD 0.1683 Tc 1.7067 Tw (microdose deposition have been observed in flight. SHE can be detected during ground) Tj
-57 -12 TD 0.1343 Tc -0.3218 Tw (testing, but again it is very difficult to accurately quantify the risk.) Tj
0 -11.25 TD 0.1803 Tc -0.3678 Tw (No SHE due to SEGR has been identified. This risk can be detected during ground testing.) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (4.5) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD 0.22 Tc 0 Tw (SEL) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1819 Tc -0.2194 Tw (Only a few part types are sensitive to SEL, but one part has shown an extremely high heavy ion and proton) Tj
0 -11.25 TD 0.1615 Tc -0.349 Tw (induced SEL sensitivity [26]. This risk can be detected during ground testing.) Tj
0 -37.5 TD /F4 12 Tf
-0.31 Tc 0 Tw (4.6) Tj
16.5 0 TD 0 Tc -0.336 Tw ( ) Tj
12 0 TD 0.0021 Tc -0.3381 Tw (SEE mitigation schemes) Tj
-28.5 -14.25 TD /F0 9.75 Tf
0.1384 Tc -0.3259 Tw (The coding techniques have shown their efficiency to mitigate ) Tj
251.25 0 TD 0.2258 Tc -0.4133 Tw (SEUs as long as the use of the parts has been) Tj
-251.25 -12 TD 0.1645 Tc -0.352 Tw (carefully considered and the risk of SMU evaluated during ground testing.) Tj
0 -11.25 TD 0.1409 Tc 0.0686 Tw (Scrubbing rates are generally calculated on the basis of daily average SEU rates. This is adequate for GEO) Tj
T* 0.1612 Tc 0.0513 Tw (or interplanetary orbits in the absence of SPE. For LEO the data shows that the ) Tj
324.75 0 TD 0.159 Tc 0.4035 Tw (SEUs occur in burst when) Tj
-324.75 -12 TD 0.1369 Tc 0.384 Tw (the spacecraft goes through the trapped proton belts. For example, on a LEO polar orbit, 80% of the SEU) Tj
0 -11.25 TD 0.1661 Tc 0.1714 Tw (occur in the SAA in bursts lasting for 5 to 10 minutes per orbit. The scrubbing rate needs to be calculated) Tj
T* 0.1665 Tc -0.1665 Tw (for these high SEU rates.) Tj
0 -12 TD 0.1479 Tc 0.9771 Tw (Only a few SEL and SEFI occurrences have been observed in flight. The memories have recovered full) Tj
0 -11.25 TD 0.142 Tc -0.2045 Tw (functionality after a power cycling and ) Tj
157.5 0 TD 0.1604 Tc 0 Tw (reinitialisation.) Tj
-157.5 -11.25 TD 0.2083 Tc -0.1458 Tw (SHEs due to ) Tj
52.5 0 TD 0.161 Tc 0.4015 Tw (microdose effects disappeared by themselves after a period ranging from seconds to months.) Tj
-52.5 -12 TD 0.2114 Tc 0.4761 Tw (As long as the SHE rate \() Tj
106.5 0 TD 0.1482 Tc 0.9912 Tw (microdose and or SEGR\) is low, they can be corrected by the SEU correction) Tj
-106.5 -11.25 TD 0.2686 Tc 0 Tw (codes.) Tj
ET
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endobj
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