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 NASA Electronic Parts and Packaging (NEPP) Program 2025 Electronics Technology Workshop |
Electronics Technology Workshop (ETW)
August 11-14, 2025
Notional Agenda
DAY 1, TUTORIAL SESSION, 8/11/2025, 1PM to 5PM
- Training/Tutorial: NASA-STD-8739.11 commodity overviews
GENERAL SCHEDULE DAYS 2-4, 8:30AM to 5:30PM, 1.5HR LUNCH, 30MIN BREAKS MORNING/AFTERNOON (adjusted as necessary)
8:30AM TO 10:00AM: 3-5 TALKS
10AM TO 10:30AM: BREAK
10:30AM TO 12PM: 3-5 TALKS
12PM TO 1:30PM LUNCH
1:30PM TO 3PM: 3-5 TALKS
3PM TO 3:30PM: BREAK
3:30PM TO 5:30PM: 4-6 TALKS
DAY 2, 8/12/2025
Morning:
- NEPP Overview (Pete Majewicz, GSFC), 30min
- EEEE Parts Mgmt (Susana Douglas, GSFC), 30min
- Keynote (Bob Hodson, LaRC), 30min
- NEPAG Update (Shri Agarwal, JPL), 20min
- GWG Update (Benny Damron, MSFC), 20min
- HWG Update (John Pandolf, LaRC), 20min
- Photonics (Hali Flores, GSFC)
o Introduction (Hali Flores, GSFC), 5min
o Evaluating Reliability of Optical Switches Using HALT Method (Alireza Azizi, JPL), 20min
o Developing Guidelines for Qualification and Screening of Integrated Photonic Devices (Alireza Azizi, JPL / Dillon Johnstone, GSFC), 20min
Afternoon:
- Photonics cont. (Hali Flores, GSFC)
o Updates to the Fiber Radiation Effects Database (Hali Flores, GSFC), 20min
o Photonic Integrated Circuits: A Breakthrough Technology for Future Hyperspectral Ultra-Wideband Planetary Boundary Layer Sounders (Fabrizio Gambini, UMBC/GSFC), 20 minutes
- WBG (Jason Osheroff, GSFC)
o When Ions Strike: Exploring How LET and Epitaxial Thickness Influence Single-Event Outcomes in Vertical Homojunction GaN Diodes (Sajal Islam, Vanderbilt University), virtual, 20min
o SEE-Hardened SiC Power Devices for Next Generation Space Applications (Arijit Sengupta, Vanderbilt University), virtual, 20min
o High Voltage Radiation Hardened GaN (Simon Wainwright, Semi Zabala), 20min
- 3D Printing / Advanced Manufacturing (Margaret Samuels, GSFC)
o Aerosol Jet Printing: Leveraging Fundamental Process Science for Reliable, Conformal, and Multi-material Patterning of Additive Electronics (Ethan Secor, Iowa State), 20min
o 5-Axis Mill and Fill for Droptower-Tested Multilayer Circuits (Harvey Tsang, Army Research Lab), 20min
o Additive Electronics Manufacturing of Passive RF Sensors and Embedded Die Packaging for Aerospace Applications (Felippe Pavinatto, GE Aerospace), 20min
o Summer 2025: Four Applications for 3D Printing of Electronics for Spaceflight (Tristan Epp Schmidt/Matthew Minogue, GSFC), 20min
DAY 3, 8/13/2025
Morning:
- Radiation Test Methodologies (Razvan Gaza, JSC)
o NASA RHA Process Standard Status (Razvan Gaza, JSC), 15min
o JPL-NRL Collaboration on Pulsed Laser SEE (Joel Hales, NRL / Greg Allen, JPL), 15 min
o NESC Assessment of Latent Damage Due to SEL (Stephen Martinez, JSC), 15 min
o Fragmentation Study to Assess Feasibility of Novel Test Method at NSRL (Brandon Reddell, Jacobs/JSC), 15 min
o Bounding SEL Rates for Null Results and Other Limited Test Data (Matthew Joplin, GSFC), 25 min
- FPGAs, Processors, Memories (Greg Allen, JPL)
o NEPP Processor Enclave (NPE) Road Mapping and RISC-V Updates (Steve Guertin, JPL), 15min
o NPE SOUNDDS Initiative (Ed Wyrwas, GSFC), 15min
o Update on BeagleV Radiation Testing (Seth Roffe, GSFC), 15min
o NEPP / OUSD T&AM Update on Single Event Effects Testing of PolarFire SoC and Versal FPGA (Greg Allen, JPL), 15min
- Failure Analysis (Lyudmyla Ochs, GSFC)
o How to Detect If a Microcircuit Part is Extensively Used Operationally – Reliability Implication of a Counterfeit Part (Sultan Lilani, Integra), 30min
o JPL Failure Analysis Examples (Gil Garteiz, JPL), 15min
Afternoon:
- Failure Analysis continued (Lyudmyla Ochs, GSFC)
o NASA Exploration Toilet Hardware Technical Challenges and Accomplishments (Melissa McKinley, JSC), 20min
o The Future of Failure Analysis (Vidu Weerasinghe, Eurofins EAG Laboratories), 20min
o IGA Study (Karl Rink, Rink International LLC), 15min
- Packaging Reliability / Advanced Packaging (Eric Suh, JPL)
o 2.5/3D Package Interconnect Metallurgy (Eric Suh, JPL), 25min
o SMD Package Cracking (Eric Suh, JPL), 25min
o HALT Test (Reza Ghaffarian, JPL), 25min
o PEM Package Molding Compound Delamination (Scott Popelar, Frontgrade), 25min
o MIL-PRF-ATM Challenges/Lessons Learned (Eli Minson, Lockheed Martin), 15min
- MBMA / SmallSat (Rebekah Austin, GSFC)
o Potential Methods for Evaluating SmallSat Risk and Robustness with Lightweight Model-Based Design (Coleman Merchant, Saint Louis University), virtual, 20min
o RADHUB Development Update (Brian Sierawski, Vanderbilt University), virtual, 20min
o Electronic Subsystem Modeling in Radiation Environments Using the SEAM Platform (Qi Zhang, Vanderbilt University), virtual, 20min
DAY 4, 8/14/2025, WFD & PEAL/COTS (Susana Douglas, GSFC), ~13-14 talks
- NASA WFD updates
o NASA Parts School Update (Thomas Sanders, JPL), 10min
o University Electronic Parts Curriculum Updates (UCF/AU/UMD), 20min
o TAMU Bootcamp Update (Mike Campola, GSFC / Greg Allen, JPL), 15min
o Engineering research for NASA technology development: From cryostat design to plasma-based oxide reduction (Daniel Ellis, University of Illinois Urbana-Champaign), 20min
* Former NEPP summer 2020/21 intern, research and graduate work, now a NASA fellow at KSC
- PEAL FY25 COTS Testing Overview (Susana Douglas, GSFC), 5min
- Micron Automotive-Grade NAND Flash Reliability and Radiation Testing (Jason Heidecker/Greg Allen, JPL), 30min
o Jason: life testing (20min)
o Greg: radiation test update or plan (10min)
- COTS DC-DC Converter Reliability Testing (Seth Gordon, JPL / Lyudmyla Ochs, GSFC / Ted Wilcox, GSFC)
o Seth: TI SEP life testing, maybe CA, 20min
o Lyudmyla: Crane Interpoint COTS life testing plans/schedule, 5min
o Ted: Radiation test plan, 5min
- Automotive-Grade Resistor Reliability Testing (Tristan Epp Schmidt, GSFC), 20min
- Automotive Grade Capacitor Accelerated Life Test at Lockheed Martin Space / NASA PEAL Collaboration (Michal Bulkowski, Lockheed Martin / Linda Del Castillo, JPL), 30min
o LM 20min
o Linda (virtual) 5min to present preliminary test results (cap breakdown testing + Kemet 250hr testing) and highlight new PEAL tests different from LM testing)
o 5min Q&A
- Reliability Assessments for AEC-Q200 Tantalum Capacitors (Alexander Teverovsky, GSFC), 30min
o Focus on reliability assessments (30min); polymer and MnO Ta caps, maybe effect of environments/ACC
- ILPM Microcircuit Reliability Testing (Matthew Minogue/Lyudmyla Ochs, GSFC), 20min
o at least on 2 ADI ICs
- NASA/JPL Avionics Roadmapping Effort (James Skinner, JPL), virtual, 10min
- NASA Parts Inventory Sharing Efforts (Susana Douglas, GSFC), 10min
- NASA/JPL Lead Time Analysis (Shayena Khandker/Danny Wu, JPL), virtual, 10min
o Lead time update, real-time monitoring effort
- GSFC Radiation Effects Testing (Mike Campola, GSFC), 25min
o Overview of SEE PEAL rad testing (not FETs) & TID tests
- JPL SEE Testing (Greg Allen, JPL), 25min
- Alternate Grade MOSFET Radiation Testing (Ted Wilcox, GSFC), 25min
-
COTS MSIW and Aerospace Activity Update (Christine
Rink, Aerospace Corporation), 30min
o
Passives related presentation; govt customer
buy-in
-
TBD DLR
presentation
NEPP Program Manager: Pete Majewicz
NEPP Deputy Manager: Susana Douglas
Site Curator: Carl Szabo