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Latest NEPP Deliverables
NASA Electrical, Electronic, and Electromechanical (EEE) Parts Manager Overview ...
Principle Investigator: Ken LaBel | Upload Date: 03/19/19
COTS 3D NAND Flash: SEE Test Results and Challenges - 2018 SEE-MAPLD Presentatio...
Principle Investigator: Edward (Ted) Wilcox | Upload Date: 03/07/19
NASA Feedback to DLA Land & Maritime Moratorium on Wafer Fab Audits - 2018 NEPP-...
Principle Investigator: Michael Sampson | Upload Date: 03/07/19
A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect P...
Principle Investigator: Michael Sampson | Upload Date: 03/07/19
Standardizing GPU Radiation Test Approaches - 2018 NSREC DW Poster Presentation
Principle Investigator: Edward Wyrwas | Upload Date: 03/07/19
Capturing and Modeling Radiation Hardness Assurance throughout the Project Lifec...
Principle Investigator: Rebekah Austin | Upload Date: 03/07/19
Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) He...
Principle Investigator: Melanie Berg | Upload Date: 03/07/19
NASA Electronic Parts and Packaging (NEPP) Program: Resources for SmallSats on E...
Principle Investigator: Ken LaBel | Upload Date: 02/28/19
NASA EEE Parts and NASA Electronic Parts and Packaging (NEPP) Program – Welcome ...
Principle Investigator: Ken LaBel | Upload Date: 02/28/19
Graphics Processing Unit (GPU) Devices - 2018 NEPP-ETW Presentation
Principle Investigator: Edward Wyrwas | Upload Date: 02/28/19
Double Data Rate (DDR) Memory Devices - 2018 NEPP-ETW Presentation
Principle Investigator: Edward Wyrwas | Upload Date: 02/28/19
Anomalous Transients in Chip Polymer Tantalum Capacitors - 2018 SPCD Paper
Principle Investigator: Alexander Teverovsky | Upload Date: 02/28/19
Cracking Problems in Low-Voltage Chip Ceramic Capacitors - 2018 BOK Paper
Principle Investigator: Alexander Teverovsky | Upload Date: 02/27/19
ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test R...
Principle Investigator: Edward Wyrwas | Upload Date: 02/27/19
A First Look at 22 nm FDSOI SRAM Single-Event Test Results - 2018 SEE-MAPLD Pres...
Principle Investigator: Megan Casey | Upload Date: 02/27/19
Standardizing GPU Radiation Test Approaches – Part 2 - 2018 SEE-MAPLD Poster Pre...
Principle Investigator: Edward Wyrwas | Upload Date: 02/27/19
Domestic North America - >200MeV Proton Access Snapshot - SEE-MAPLD 2018 Poster
Principle Investigator: Ken LaBel | Upload Date: 02/27/19
NEPP Evaluation of Automotive Grade Tantalum Chip Capacitors - 2018 CMSE Present...
Principle Investigator: Michael Sampson | Upload Date: 02/27/19
Reliability Concerns for Flying SiC Power MOSFETs in Space - 2018 HEART Paper
Principle Investigator: Jean-Marie Lauenstein | Upload Date: 02/27/19
Reliability Concerns for Flying SiC Power MOSFETs in Space - 2018 HEART Presenta...
Principle Investigator: Jean-Marie Lauenstein | Upload Date: 02/27/19
Cracking Problems and Mechanical Characteristics of PME and BME Ceramic Capacito...
Principle Investigator: Alexander Teverovsky | Upload Date: 02/27/19
 

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