1. Derate the /540 parts linearly at 0.428 W/°C for TC > 0 °C
2.0 Derate the /527 parts linearly at 567 mW/°C for TC > +25 °C
3. All JANTXV transistors
must be PIND tested in accordance with MIL-STD-750, Method 2052, Condition
A. Additional testing is not required when procured directly from the manufacturer
with PIND testing in accordance with MIL-PRF-19500.
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