NASA Parts Selection List (NPSL)
Application Notes
Transistors, Silicon
PNP, Darlington

1. Derate the /540 parts linearly at 0.428 W/°C for TC > 0 °C

2.0 Derate the /527 parts linearly at 567 mW/°C for TC > +25 °C

3. All JANTXV transistors must be PIND tested in accordance with MIL-STD-750, Method 2052, Condition A. Additional testing is not required when procured directly from the manufacturer with PIND testing in accordance with MIL-PRF-19500.

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Parts Selection