NASA Parts Selection List (NPSL)
Application Notes
Field Effect Transistor (FET)
1. Refer to detailed part specification for applicable power derating factors.

2. All JANTXV transistors must be PIND tested in accordance with MIL-STD-750, Method 2052, Condition A. Additional testing is not required when procured directly from the manufacturer with PIND testing in accordance with MIL-PRF-19500.

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Parts Selection