NASA Parts Selection List (NPSL)
 
Application Notes
 
Field Effect Transistor (FET)
N-Channel
 
1. Refer to detailed part specification for applicable power derating factors.

2. All JANTXV transistors must be PIND tested in accordance with MIL-STD-750, Method 2052, Condition A. Additional testing is not required when procured directly from the manufacturer with PIND testing in accordance with MIL-PRF-19500.
 

NPSL Home Page
Parts Selection
Summary
Type