1. Derate 2N918 linearly
at 1.71 mW/°C for TC > +25 °C. Refer to the detailed
specification regarding derating factor for other parts listed herein.
2. All JANTXV transistors
must be PIND tested in accordance with MIL-STD-750, Method 2052, Condition
A. Additional testing is not required when procured directly from the manufacturer
with PIND testing in accordance with MIL-PRF-19500.