NASA Parts Selection List (NPSL)
 
Application Notes
 
Transistors, Silicon
RF, NPN
 
1. Derate 2N918 linearly at 1.71 mW/°C for TC > +25 °C. Refer to the detailed specification regarding derating factor for other parts listed herein.

2. All JANTXV transistors must be PIND tested in accordance with MIL-STD-750, Method 2052, Condition A. Additional testing is not required when procured directly from the manufacturer with PIND testing in accordance with MIL-PRF-19500.
 

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