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All 2021 NEPP ETW Talks
FileSize
2021_NEPP_ETW_Talks.zip191370 K
14-JUN-2021-MON
FileSize
1000 - Majewicz - The State of NEPP NASA Electronic Parts & Packaging Program716 K
1030 - Lindsey - OSMA Digital Evolution: R&M Physics of Failure (PoF) Handbook1426 K
1100 - Pellish - NASA EEEE Parts Management Overview & Status4871 K
1130 - McClure - Keynote - NASA's Europa Clipper Mission: Drawing from the NEPP Knowledge Base13711 K
1230 - Green/Siddiqi - NASA Standard for Screening and Lot Acceptance Testing Based on Mission Classification1898 K
1300 - Agarwal - NEPAG Report NASA Electronic Parts Assurance Group3546 K
1330 - Laird - Government Working Group (GWG) Update1250 K
1400 - Pandolf - NEPP/NEPAG DC/DC Converter & Hybrid Working Group737 K
1430 - Agarwal - MIL-PRF-38535 Standard Microcircuits Hermetic and Non-hermetic3000 K
1500 - Damron - MIL-PRF-19500 Appendix J Task Group Status for NEPP ETW2915 K
1530 - Agarwal - Electronic Parts and Electrostatic Discharge - Gaps and Mitigation Strategies Lessons Learned1046 K
1600 - Brusse - Task Group for Improvements to MIL-STD-1580 DPA for EEE Parts1162 K
1630 - Shinichiroh Ichimaru - Invited Talk - On-orbit Validation to Mitigate Tin Whisker Growth3493 K
15-JUN-2021-TUE
FileSize
1000 - Pellish - Avionics Radiation Hardness Assurance (RHA) Guidelines1042 K
1015 - Clark - Radiation Effects Boot Camp & MS Degree in Radiation Effects1326 K
1030 - Pellish - Heavy Ion Single-Event Effects (SEE) Test Facility Status and General Implications for Space System Evolution2922 K
1100 - LaBel - Is High Energy Heavy Ion Testing the Future for Single-Event Effects (SEE) in Devices and Systems?1059 K
1130 - Skinner - Mars 2020 and Mars Sample Return Program Overviews, LVS, and Example of NEPP Contribution3469 K
1230 - Lauenstein - Wide Bandgap Power Device Radiation Reliability6239 K
1315 - Osheroff - Proton Recoils in GaN & Upcoming RF GaN Work1604 K
1330 - Witulski - Modeling, Testing, and Simulation of Heavy-Ion Basic Mechanisms in Silicon Carbide Power Devices1523 K
1345 - Sheldon - 2.5/3D HI Packaging – Foundation and Future Vision2502 K
1400 - Ralph - Electronic-Photonic Integrated Circuits for Aerospace (EPICA)8094 K
1430 - Suh - 2.5/3D Packaging Technology Challenges for Space Components2430 K
1500 - Ramamurthy - Chiplet Technology & Heterogeneous Integration414 K
1530 - Ghaffarian - M2020/NEPP TCL Evaluation for Electronics Packaging3829 K
1600 - Jakeman-Flores - Photonics for Space Flight Instruments2688 K
1630_a - Bozovich - NEPP Space Qualification Efforts for Photonic Integrated Circuits (PICs)20935 K
1630_b - Tzintzarov/Cressler - Radiation Effects in Integrated Silicon Photonic Systems7529 K
16-JUN-2021-WED
FileSize
1000 - Casey - Session Intro - NEPP Processors, FPGAs, and Memories Efforts297 K
1015 - Casey - Update on Scaled CMOS Task and Future Plans1211 K
1030_a - Wyrwas - NEPP Processor Enclave: Post COVID Update371 K
1030_b - Guertin - NEPP Processor Enclave - ARM Radiation Testing Update and Raspberry Pi Guideline1161 K
1100 - Wilcox - Non-Volatile Memory Radiation Update753 K
1115 - Breeding - A Monte Carlo-Based Analysis of Radiation Effects Mechanisms in 3D NAND Memories1710 K
1130 - Berg - NEPP 2021 FPGA Radiation Effects Update: Microchip PolarFire (Single Event Effects) and Lattice Crosslink (Total Ionizing Dose)3049 K
1200 - Champagne - Extending A Probabilistic Method for Total Ionizing Dose Failure to Multi-Component Systems709 K
1215 - Reaz - Model- and Testing-Based Assurance of Cache Memory of a Single-Board Computing System in Radiation Environments1014 K
1230 - Sierawski - Evaluating SEE Rate Prediction Methods for Complex Devices850 K
1315 - Devaney - COTS Trends in DPA Results from 20204428 K
1345 - Teverovsky - Lessons Learned from Screening and Qualification of COTS Capacitors4317 K
1415 - Rosol - Red Plague Control Plan vs Hydrofluoric Acid Corrosion Mitigation1070 K
1445 - Gore - Enhanced-Assurance-Hybrids244 K
1515 - Panashchenko-Ochs - NASA GSFC EEE Parts: DPA and FA Summary3890 K
1545 - Teverovsky - Effect of High Temperature Storage on AC Characteristics of Polymer Tantalum Capacitors4699 K
1615 - Agarwal - Electronic Parts and Electrostatic Discharge - Gaps and Mitigation Strategies Lessons Learned1046 K
17-JUN-2021-THU
FileSize
1000 - Austin - Status of NEPP SmallSat Efforts377 K
1015 - Chen - NESC Assessment - Recommendations on Use of Commercial-Off-The-Shelf (COTS) Parts for NASA Missions329 K
1045 - Nikulainen/Tonicello - Utilization of COTS in ESA Missions2103 K
1115 - Robertson - The SSRI Knowledge Base: Updates and Demonstration916 K
1130 - Luna - Space Technology Mission Directorate Small Spacecraft Technology1593 K
1200 - Yarbrough - PMPedia™: A Crowd-Sourced Alternate-Grade Electronics Space Radiation Knowledge Repository4266 K
1230 - Swartwout - Small Satellite Reliability: Database Update and Identifying Best Practices4621 K
1330 - Austin - Status of NEPP Model-Based Mission Assurance Efforts1170 K
1345 - Nederlander - Systematic Approach to Parts Selection and Radiation Assessment for Mission Profiles2292 K
1415 - Panashchenko-Ochs - The Art of Metal Whisker Appreciation:A Practical Guide for Electronics Professionals11218 K
1515 - Lilani - PEMs-and-Copper-Bond-Wire-Standards-and-Testing36959 K