|
About
NPSL
Prohibited
Materials
Parts
Selection Table of Contents
|
NASA Parts
Selection List (NPSL)
DIODES
MIL-PRF-19500 Part Number Explanation
Example: JAN#%1N3891AR-1
where,
| JAN |
Joint
Army and Navy (JAN) Military Part Designator |
| # |
Quality
Level |
| % |
Indicates
Radiation Hardness Assurance (RHA) Level |
| 1N |
Component
designator for Diodes |
| 3891 |
Identification
Number |
| AR |
Suffix
Letters |
| -1 |
Indicates
metallurgical bond |
Quality Level, (#)
|
JANS or S |
Highest
Quality Level 1 |
| TXV
|
Level
2 |
| TX
|
|
Radiation Hardness Assurance Level, (%)
| RHA
Designator |
Total
Ionizing Dose (RAD
(Si)) |
Neutron
Fluence (n/cm2)
|
| M
|
3
x 103 |
2
x 1012 |
| D
|
1
x 104 |
2
x 1012 |
| L
|
5
x 104 |
2
x 1012 |
| R
|
1
x 105 |
2
x 1012 |
| F
|
3
x 105 |
2
x 1012 |
| G
|
6
x 105 |
2
x 1012 |
| H
|
1
x 106 |
2
x 1012 |
NOTE:
Unless specifically stated within the parts selection tables of the
NPSL, listing of a device technology herein does NOT imply/guarantee
Radiation Hardness Assurance (RHA). Applications concerned with a device's
ability to tolerate exposure to various forms of space radiation (e.g.,
total ionizing dose, single event effects, etc.) should be reviewed
and have the device assessed by the Program's radiation assurance experts.
The following resources may also be consulted for initial guidance:
NASA
Goddard Radiation Effects and Analysis
Jet Propulsion Laboratory
Radiation Effects
Suffix letters
| A,
B, C, etc |
Indicates
a modified version which is substitutable for the basic numbered
(non-suffix) device |
| M
|
Indicates
matching of specified parameters of separate devices |
| R
|
Indicates
reverse polarity packaging of the basic numbered device |
| L
or S |
Indicates
that the terminal leads are longer or shorter, respectively than
those of the basic numbered device |
| U
|
Indicates
leaded or surface mounted devices |
| UR
|
Indicates
leaded or surface mounted (round end cap diodes) |
| US
|
Indicates
leaded or surface mounted (square end cap diodes) |
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