NEPP ETW 2012 Header

NEPP ETW 2012 Preliminary Schedule

Monday - June 11, 2012
Start Finish Session Topic First Last Organization
12:00 13:00 Registration (non-NASA at Visitor Center)
13:00 13:30 Welcome and Intro Ken
13:30 14:15 Invited Parts Reliability vs System Reliability Yuan Chen NASA/LaRC
14:15 15:00 Passives NEPP Capacitor Update Alexander
15:00 15:30 Break        
15:30 16:00 Power Characterization of Tantalum Polymer Capacitors Penelope Spence JPL
16:00 16:30 NEPAG DC-DC Working Group Outbrief John Pandolf NASA/LaRC
16:30 17:00 NEPAG NEPAG Update Shri Agarwal JPL
Tuesday - June 12, 2012
Start Finish Session Topic First Last Organization
8:30 9:00 Invited Talk 3D IC Overview Robert Patti Tezzaron
9:00 9:30 CMOS VLSI Technology Reliability Update Douglas Sheldon JPL
9:30 10:00 Memories Updated SSR Radiation Guidelines Ray Ladbury NASA/GSFC
10:00 10:20 Break        
10:20 10:45 Memories Flash Qualification Guidelines Jason Heidecker JPL
10:45 11:10 Memories MRAM Technology and Status Jason Heidecker JPL
11:10 11:35 Memories Combined Effects on DDR Class Memories Ray Ladbury NASA/GSFC
11:35 12:00 Memories DDR2 Device Reliability Update Steve Guertin JPL
12:00 13:00 Lunch        
13:00 13:30 Advanced Technologies Through Silicon Via Technology Status Peter Dillon JPL
13:30 14:00 Radiation Single Event Effects (SEE) Challenges: Testing and Modeling Shortfalls Ken LaBel NASA/GSFC
14:00 14:30 Radiation Update on Scaled CMOS Radiation Hardness Assurance Jonathan Pellish NASA/GSFC
14:30 15:00 Radiation Radiation Qualification of Flash Memories Tim Oldham Dell-NASA/GSFC
15:00 15:15 Break        
15:15 15:45 Radiation Low-Energy Proton Single Event Upsets in SRAMs Brian Sierawski Vanderbilt
15:45 16:05 Radiation NVM Radiation Tests Farohk Irom JPL
16:05 16:25 Radiation Commercial Off The Shelf (COTS): Radiation Effects Considerations and Approaches Ken LaBel NASA/GSFC
16:25 16:50 Radiation Observed Diode Failures in DC-DC Converters Robert Gigliuto MEI-NASA/GSFC
16:50 17:15 Radiation Correlation of Pulsed Laser and Heavy Ion Test Results for NAND Flash Memory Tim Oldham Dell-NASA/GSFC
Wednesday - June 13, 2012
Start Finish Session Topic First Last Organization
8:30 9:00 FPGA/SOC Single Event Effects in Field Programmable Gate Array Devices: Update 2012 Melanie Berg MEI-NASA/GSFC
9:00 9:30 FPGA/SOC Reliability Testing of CGA/LGA Packages Reza Ghaffarian JPL
9:30 10:00 FPGA/SOC A Newly Developed Approach to Total Ionizing Dose Testing for Field Programmable Gate Array Devices Melanie Berg MEI-NASA/GSFC
10:00 10:15 Break        
10:15 10:30 FPGA/SOC Physics of Failure of Non-Hermetic Flip Chip Column Grid Packages and Testing Update Jong-ook Suh JPL
10:30 11:00 Invited Power for FPGAs John Shue NASA/GSFC
11:00 11:40 Power Point-of-Load Devices for Space Dakai Philippe Chen, Adell NASA/GSFC, JPL
11:40 12:00 Power Recent Power Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Test Results Jean Marie Lauenstein NASA/GSFC
12:00 13:00 Lunch        
13:00 13:20 Power Rad Effects in Newly Available MOSFETS Leif Scheick JPL
13:20 13:50 Power Challenges for Radiation Hardness Assurance (RHA) on Power MOSFETs Jean Marie Lauenstein NASA/GSFC
13:50 14:20 Power Wide Bandgap Working Group      
14:20 14:40 Power GaN/SiC Reliability Testing Richard Patterson NASA/GRC
14:40 15:00 Power Rad Effects in Emerging GaN FETs Leif Scheick JPL
15:00 15:15 Break        
15:15 15:45 HiREV HiREV Overview and Status Chris Bozada AFRL Sensors Directorate
15:45 16:15 HiREV GaN Reliability Eric Heller, PhD AFRL Materials and Manufacturing Directorate
16:15 16:45 HiREV CMOS Physics of Failure Lifetime Modeling Jon Osborne The Aerospace Corporation
16:45 17:15 HiREV Testing Reliability Standards - Cost Benefit Analysis James Theimer, PhD AFRL Sensors Directorate


NEPP Co-Managers: Ken LaBel & Mike Sampson
Site Curator: Carl Szabo