NEPP ETW 2012 Presentation Materials
| Download ZIP file with all available talks (44MB) Talks without Release Forms are unavailable for download |
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| Monday - June 11, 2012 | ||||||
| Start | Finish | Session | Topic | First | Last | Organization |
| 12:00 | 13:00 | Registration (non-NASA at Visitor Center) | ||||
| 13:00 | 13:30 | Welcome and Intro | Ken Mike |
LaBel Sampson |
NASA/GSFC | |
| 13:30 | 14:15 | Invited | Parts Reliability vs System Reliability | Yuan | Chen | NASA/LaRC |
| 14:15 | 15:00 | Passives | NEPP Capacitor Update | Alexander David |
Teverovsky Liu |
DSFG-NASA/GSFC MEI-NASA/GSFC |
| 15:00 | 15:30 | Break | ||||
| 15:30 | 16:00 | Power | Characterization of Tantalum Polymer Capacitors | Penelope | Spence | JPL |
| 16:00 | 16:30 | NEPAG | DC-DC Working Group Outbrief | John | Pandolf | NASA/LaRC |
| 16:30 | 17:00 | NEPAG | NEPAG Update | Shri | Agarwal | JPL |
| Tuesday - June 12, 2012 | ||||||
| Start | Finish | Session | Topic | First | Last | Organization |
| 8:30 | 9:00 | Invited Talk | 3D IC Overview | Robert | Patti | Tezzaron |
| 9:00 | 9:30 | CMOS | VLSI Technology Reliability Update | Douglas | Sheldon | JPL |
| 9:30 | 10:00 | Memories | Updated SSR Radiation Guidelines | Ray | Ladbury | NASA/GSFC |
| 10:00 | 10:20 | Break | ||||
| 10:20 | 10:45 | Memories | Flash Qualification Guidelines | Jason | Heidecker | JPL |
| 10:45 | 11:10 | Memories | MRAM Technology and Status | Jason | Heidecker | JPL |
| 11:10 | 11:35 | Memories | Combined Effects on DDR Class Memories | Ray | Ladbury | NASA/GSFC |
| 11:35 | 12:00 | Memories | DDR2 Device Reliability Update | Steve | Guertin | JPL |
| 12:00 | 13:00 | Lunch | ||||
| 13:00 | 13:30 | Advanced Technologies | Through Silicon Via Technology Status | Peter | Dillon | JPL |
| 13:30 | 14:00 | Radiation | Single Event Effects (SEE) Challenges: Testing and Modeling Shortfalls | Ken | LaBel | NASA/GSFC |
| 14:00 | 14:30 | Radiation | Update on Scaled CMOS Radiation Hardness Assurance | Jonathan | Pellish | NASA/GSFC |
| 14:30 | 15:00 | Radiation | Radiation Qualification of Flash Memories | Tim | Oldham | Dell-NASA/GSFC |
| 15:00 | 15:15 | Break | ||||
| 15:15 | 15:45 | Radiation | Low-Energy Proton Single Event Upsets in SRAMs | Brian | Sierawski | Vanderbilt |
| 15:45 | 16:05 | Radiation | NVM Radiation Tests | Farohk | Irom | JPL |
| 16:05 | 16:25 | Radiation | Commercial Off The Shelf (COTS): Radiation Effects Considerations and Approaches | Ken | LaBel | NASA/GSFC |
| 16:25 | 16:50 | Radiation | Observed Diode Failures in DC-DC Converters | Robert | Gigliuto | MEI-NASA/GSFC |
| 16:50 | 17:15 | Radiation | Correlation of Pulsed Laser and Heavy Ion Test Results for NAND Flash Memory | Tim | Oldham | Dell-NASA/GSFC |
| Wednesday - June 13, 2012 | ||||||
| Start | Finish | Session | Topic | First | Last | Organization |
| 8:30 | 9:00 | FPGA/SOC | Single Event Effects in Field Programmable Gate Array Devices: Update 2012 | Melanie | Berg | MEI-NASA/GSFC |
| 9:00 | 9:30 | FPGA/SOC | Reliability Testing of CGA/LGA Packages | Reza | Ghaffarian | JPL |
| 9:30 | 10:00 | FPGA/SOC | A Newly Developed Approach to Total Ionizing Dose Testing for Field Programmable Gate Array Devices | Melanie | Berg | MEI-NASA/GSFC |
| 10:00 | 10:15 | Break | ||||
| 10:15 | 10:30 | FPGA/SOC | Physics of Failure of Non-Hermetic Flip Chip Column Grid Packages and Testing Update | Jong-ook | Suh | JPL |
| 10:30 | 11:00 | Invited | Power for FPGAs | John | Shue | NASA/GSFC |
| 11:00 | 11:40 | Power | Point-of-Load Devices for Space | Dakai Philippe | Chen, Adell | NASA/GSFC, JPL |
| 11:40 | 12:00 | Power | Recent Power Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Test Results | Jean Marie | Lauenstein | NASA/GSFC |
| 12:00 | 13:00 | Lunch | ||||
| 13:00 | 13:20 | Power | Rad Effects in Newly Available MOSFETS | Leif | Scheick | JPL |
| 13:20 | 13:50 | Power | Challenges for Radiation Hardness Assurance (RHA) on Power MOSFETs | Jean Marie | Lauenstein | NASA/GSFC |
| 13:50 | 14:20 | Power | Wide Bandgap Working Group | Megan | Casey | NASA/GSFC |
| 14:20 | 14:40 | Power | GaN/SiC Reliability Testing | Richard | Patterson | NASA/GRC |
| 14:40 | 15:00 | Power | Rad Effects in Emerging GaN FETs | Leif | Scheick | JPL |
| 15:00 | 15:15 | Break | ||||
| 15:15 | 15:45 | HiREV | HiREV Overview and Status | Chris | Bozada | AFRL Sensors Directorate |
| 15:45 | 16:15 | HiREV | GaN Reliability | Eric | Heller, PhD | AFRL Materials and Manufacturing Directorate |
| 16:15 | 16:45 | HiREV | CMOS Physics of Failure Lifetime Modeling | Jon | Osborn | The Aerospace Corporation |
| 16:45 | 17:15 | HiREV | Testing Reliability Standards - Cost Benefit Analysis | James | Theimer, PhD | AFRL Sensors Directorate |
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