Time |
Wednesday 6/18 |
8:00 AM |
Coffee and Registration Check-In
|
9:00 AM |
Keynote: NASA Radiation Hardness Assurance
Ken LaBel |
9:30 AM |
Invited: Reliable Space Systems from Unreliable Parts?
Henning Leidecker |
10:00 AM |
Break (30 min) |
10:30 AM |
(HiREV Invited Talk)
Device-Level BTI-induced Timing Jitter Increase in Circuit-Speed Random Logic Operation
K.P. Cheung, NIST |
11:00 AM |
National High Reliability Electronics Virtual Center Program Update
Daniel Marrujo, DMEA |
11:20 AM |
Analog Digital Signal Processor Multi-Chip Module
CJ Land, Harris Corporation |
11:50 AM |
Lunch (90 min) |
1:20 PM |
Open Questions in GaN Physics of Failure: Focus on Chennel Hot Carrier Stress
Dr. Eric Heller, AFRL RX
|
1:50 PM |
GaN Defects Observed by EBIC, AFM, and CL
Stephen Tetlak, AFRL RY
|
2:15 PM |
Study of Cross-Sectioned GaN HEMT Devices
Dr. Albert Hilton, Wyle Aerospace Group
|
2:40 PM |
AFRL/RVSE Reliability Effort Update
Keith Avery, ARFL RV |
3:05 PM |
Break (25 min) |
3:30 PM |
CALM 90nm
Presentation -- CALM Spec/API
Jon Osborn, Lead
(This talk was originally unavailable during the ETW) |
4:00 PM |
Side Meetings
(Online access will not be available) |
4:30 PM |
5:00 PM |
End of Day 2 |
|